DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, JayHyung | ko |
dc.contributor.author | Lee, Kwang S. | ko |
dc.date.accessioned | 2013-03-08T10:33:37Z | - |
dc.date.available | 2013-03-08T10:33:37Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2007-10 | - |
dc.identifier.citation | CONTROL ENGINEERING PRACTICE, v.15, no.10, pp.1306 - 1318 | - |
dc.identifier.issn | 0967-0661 | - |
dc.identifier.uri | http://hdl.handle.net/10203/92842 | - |
dc.description.abstract | With the recent emphasis on batch processing by emerging industries like the microelectronics and biotechnology, the interest in batch process control has been renewed. This paper gives an overview of the iterative learning control (ILC) technique, which can be used to improve tracking control performance in batch processes. The fundamental concepts and review of the various ILC algorithms are presented, with a particular focus on a model-based algorithm called Q-ILC and an application involving a rapid thermal processing (RTP) system. The study indicates that one can solve a seemingly very difficult multivariable nonlinear tracking problem with relative case by intelligently combining the ILC technique with basic process insights and standard system identification techniques. Some related techniques in the literature are brought forth with the hope of unifying them. We aslo suggest some remaining challenges. (c) 2007 Elsevier Ltd. All rights reserved. | - |
dc.language | English | - |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
dc.subject | MODEL-PREDICTIVE CONTROL | - |
dc.subject | WAFER TEMPERATURE UNIFORMITY | - |
dc.subject | REPETITIVE CONTROL | - |
dc.subject | SYSTEM | - |
dc.subject | CONVERGENCE | - |
dc.subject | ALGORITHM | - |
dc.title | Iterative learning control applied to batch processes: An overview | - |
dc.type | Article | - |
dc.identifier.wosid | 000249231700010 | - |
dc.identifier.scopusid | 2-s2.0-34547487982 | - |
dc.type.rims | ART | - |
dc.citation.volume | 15 | - |
dc.citation.issue | 10 | - |
dc.citation.beginningpage | 1306 | - |
dc.citation.endingpage | 1318 | - |
dc.citation.publicationname | CONTROL ENGINEERING PRACTICE | - |
dc.identifier.doi | 10.1016/j.conengprac.2006.11.013 | - |
dc.contributor.localauthor | Lee, JayHyung | - |
dc.contributor.nonIdAuthor | Lee, Kwang S. | - |
dc.type.journalArticle | Article; Proceedings Paper | - |
dc.subject.keywordAuthor | tracking control | - |
dc.subject.keywordAuthor | iterative learning control | - |
dc.subject.keywordAuthor | model-based control | - |
dc.subject.keywordAuthor | batch process control | - |
dc.subject.keywordPlus | MODEL-PREDICTIVE CONTROL | - |
dc.subject.keywordPlus | WAFER TEMPERATURE UNIFORMITY | - |
dc.subject.keywordPlus | REPETITIVE CONTROL | - |
dc.subject.keywordPlus | SYSTEM | - |
dc.subject.keywordPlus | CONVERGENCE | - |
dc.subject.keywordPlus | ALGORITHM | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.