DC Field | Value | Language |
---|---|---|
dc.contributor.author | Cha, J. | ko |
dc.contributor.author | Ha, Jeongseok | ko |
dc.contributor.author | Kang, Joonhyuk | ko |
dc.date.accessioned | 2013-03-07T17:23:12Z | - |
dc.date.available | 2013-03-07T17:23:12Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2007-11 | - |
dc.identifier.citation | ELECTRONICS LETTERS, v.43, no.24, pp.1374 - 1376 | - |
dc.identifier.issn | 0013-5194 | - |
dc.identifier.uri | http://hdl.handle.net/10203/90771 | - |
dc.description.abstract | A computationally efficient V-BLAST detection scheme on Rayleigh flat-fading channels is proposed. The proposed scheme provides a near-ML performance with significantly reduced complexity as compared to other well-known detection techniques. Moreover. the reduced complexity is independent of signal-to-noise ratio, which is a big practical advantage. | - |
dc.language | English | - |
dc.publisher | INST ENGINEERING TECHNOLOGY-IET | - |
dc.title | Low-complexity iterative QRD-M detection algorithm for V-BLAST systems | - |
dc.type | Article | - |
dc.identifier.wosid | 000252184800034 | - |
dc.identifier.scopusid | 2-s2.0-36448980319 | - |
dc.type.rims | ART | - |
dc.citation.volume | 43 | - |
dc.citation.issue | 24 | - |
dc.citation.beginningpage | 1374 | - |
dc.citation.endingpage | 1376 | - |
dc.citation.publicationname | ELECTRONICS LETTERS | - |
dc.identifier.doi | 10.1049/el:20072013 | - |
dc.contributor.localauthor | Ha, Jeongseok | - |
dc.contributor.localauthor | Kang, Joonhyuk | - |
dc.contributor.nonIdAuthor | Cha, J. | - |
dc.type.journalArticle | Article | - |
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