Mechanical and electrical properties of CdTe tetrapods studied by atomic force microscopy

Abstract

The mechanical and electrical properties of CdTe tetrapod-shaped nanocrystals have been studied with atomic force microscopy. Tapping mode images of tetrapods deposited on silicon wafers revealed that they contact the surface with three of its arms. The length of these arms was found to be 130 +/- 10 nm. A large fraction of the tetrapods had a shortened vertical arm as a result of fracture during sample preparation. Fracture also occurs when the applied load is a few nanonewtons. Compression experiments with the atomic force microscope tip indicate that tetrapods with the shortened vertical arm deform elastically when the applied force was less than 50 nN. Above 90 nN additional fracture events occurred that further shortened the vertical arm. Loads above 130 nN produced irreversible damage to the other arms as well. Current-voltage characteristics of tetrapods deposited on gold revealed a semiconducting behavior with a current gap of similar to 2 eV at low loads (< 50 nN) and a narrowing to about 1 eV at loads between 60 and 110 nN. Atomistic force field calculations of the deformation suggest that the ends of the tetrapod arms are stuck during compression so that the deformations are due to bending modes. Empirical pseudopotential calculation of the electron states indicates that the reduction of the current gap is due to electrostatic effects, rather than strain deformation effects inside the tetrapod.