Mechanical and charge transport properties of alkanethiol self-assembled monolayers on a Au(111) surface: The role of molecular tilt

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dc.contributor.authorQi, YBko
dc.contributor.authorRatera, Iko
dc.contributor.authorPark, JeongYoungko
dc.contributor.authorAshby, PDko
dc.contributor.authorQuek, SYko
dc.contributor.authorNeaton, JBko
dc.contributor.authorSalmeron, Mko
dc.date.accessioned2013-03-07T15:11:20Z-
dc.date.available2013-03-07T15:11:20Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2008-03-
dc.identifier.citationLANGMUIR, v.24, no.5, pp.2219 - 2223-
dc.identifier.issn0743-7463-
dc.identifier.urihttp://hdl.handle.net/10203/90470-
dc.description.abstractThe relationship between charge transport and mechanical properties of alkanethiol self-assembled monolayers (SAMs) on Au(111) films has been investigated using an atomic force microscope with a conductive tip. Molecular tilts induced by the pressure applied by the tip cause stepwise increases in film conductivity. A decay constant beta = 0.57 +/- 0.03 angstrom(-1) was found for the current passing through the film as a function of tip-substrate separation due to this molecular tilt. This is significantly smaller than the value of similar to 1 angstrom(-1) found when the,separation is varied by changing the length of the alkanethiol molecules. Calculations indicate that, for isolated dithiol molecules S-bonded to hollow sites, the junction conductance does not vary significantly as a function of molecular tilt. The impact of S-Au bonding on SAM conductance is discussed.-
dc.languageEnglish-
dc.publisherAMER CHEMICAL SOC-
dc.subjectATOMIC-FORCE MICROSCOPY-
dc.subjectSCANNING-TUNNELING-MICROSCOPY-
dc.subjectPHOTOVOLTAIC CELLS-
dc.subjectORGANIC-MOLECULES-
dc.subjectMETAL JUNCTIONS-
dc.subjectFILMS-
dc.subjectADSORPTION-
dc.subjectGOLD-
dc.subjectRESISTANCE-
dc.subjectPRESSURE-
dc.titleMechanical and charge transport properties of alkanethiol self-assembled monolayers on a Au(111) surface: The role of molecular tilt-
dc.typeArticle-
dc.identifier.wosid000253460200095-
dc.identifier.scopusid2-s2.0-41849133188-
dc.type.rimsART-
dc.citation.volume24-
dc.citation.issue5-
dc.citation.beginningpage2219-
dc.citation.endingpage2223-
dc.citation.publicationnameLANGMUIR-
dc.identifier.doi10.1021/la703147q-
dc.contributor.localauthorPark, JeongYoung-
dc.contributor.nonIdAuthorQi, YB-
dc.contributor.nonIdAuthorRatera, I-
dc.contributor.nonIdAuthorAshby, PD-
dc.contributor.nonIdAuthorQuek, SY-
dc.contributor.nonIdAuthorNeaton, JB-
dc.contributor.nonIdAuthorSalmeron, M-
dc.type.journalArticleArticle-
dc.subject.keywordPlusATOMIC-FORCE MICROSCOPY-
dc.subject.keywordPlusSCANNING-TUNNELING-MICROSCOPY-
dc.subject.keywordPlusPHOTOVOLTAIC CELLS-
dc.subject.keywordPlusORGANIC-MOLECULES-
dc.subject.keywordPlusMETAL JUNCTIONS-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusADSORPTION-
dc.subject.keywordPlusGOLD-
dc.subject.keywordPlusRESISTANCE-
dc.subject.keywordPlusPRESSURE-
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