Differential method against motion artefacts in skin conductance response measurement
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Geehyuk | ko |
| dc.contributor.author | Choi, J | ko |
| dc.date.accessioned | 2013-03-07T12:04:29Z | - |
| dc.date.available | 2013-03-07T12:04:29Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2007-03 | - |
| dc.identifier.citation | ELECTRONICS LETTERS, v.43, pp.375 - 377 | - |
| dc.identifier.issn | 0013-5194 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/90130 | - |
| dc.description.abstract | A differential inethod is proposed that can reduce motion artefacts in the bipolar measurement of skin conductance response. It is based on the fact that both the conductive and the capacitive currents across the skin are proportional to the contact area while only the conductive current reflects the sweat gland activity. Experimental results with a prototype system are presented. | - |
| dc.language | English | - |
| dc.publisher | INST ENGINEERING TECHNOLOGY-IET | - |
| dc.title | Differential method against motion artefacts in skin conductance response measurement | - |
| dc.type | Article | - |
| dc.identifier.wosid | 000246291800005 | - |
| dc.identifier.scopusid | 2-s2.0-34047163607 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 43 | - |
| dc.citation.beginningpage | 375 | - |
| dc.citation.endingpage | 377 | - |
| dc.citation.publicationname | ELECTRONICS LETTERS | - |
| dc.identifier.doi | 10.1049/el:20073717 | - |
| dc.contributor.localauthor | Lee, Geehyuk | - |
| dc.contributor.nonIdAuthor | Choi, J | - |
| dc.type.journalArticle | Article | - |
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