Solid-state lasers for frequency metrology

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The unique properties of solid-state laser materials such as ultrawide bandwidth and long upper-state lifetimes enable unique tools for frequency metrology. We report on recent progress in femtosecond laser frequency combs from octave-spanning Ti:sapphire lasers and single-frequency microchip lasers. ? 2005 IEEE.
Publisher
Institute of Electrical and Electronics Engineers
Issue Date
2005
Language
English
Citation

LEOS SUMMER TOPICAL MEETING, v.2005, no.0, pp.85 - 86

ISSN
1099-4742
URI
http://hdl.handle.net/10203/88298
Appears in Collection
ME-Journal Papers(저널논문)
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