DC Field | Value | Language |
---|---|---|
dc.contributor.author | Joo, Ki-Nam | ko |
dc.contributor.author | Kim, Seung-Woo | ko |
dc.date.accessioned | 2013-03-06T16:47:13Z | - |
dc.date.available | 2013-03-06T16:47:13Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2007-03 | - |
dc.identifier.citation | OPTICS LETTERS, v.32, no.6, pp.647 - 649 | - |
dc.identifier.issn | 0146-9592 | - |
dc.identifier.uri | http://hdl.handle.net/10203/87650 | - |
dc.description.abstract | We describe a measurement method of refractive indices by way of spectrally resolved interferometry using a feratosecond pulse laser. The method is dispersion insensitive and requires no prior precise knowledge of the geometrical thickness of the specimen. Not only the group but also the phase refractive index can be determined over the wide spectral range covered by the optical comb of the feratosecond pulse laser in use. (c) 2007 Optical Society of America | - |
dc.language | English | - |
dc.publisher | OPTICAL SOC AMER | - |
dc.subject | LOW-COHERENCE INTERFEROMETRY | - |
dc.subject | THICKNESS | - |
dc.title | Refractive index measurement by spectrally resolved interferometry using a femtosecond pulse laser | - |
dc.type | Article | - |
dc.identifier.wosid | 000244726900022 | - |
dc.identifier.scopusid | 2-s2.0-33847681520 | - |
dc.type.rims | ART | - |
dc.citation.volume | 32 | - |
dc.citation.issue | 6 | - |
dc.citation.beginningpage | 647 | - |
dc.citation.endingpage | 649 | - |
dc.citation.publicationname | OPTICS LETTERS | - |
dc.identifier.doi | 10.1364/OL.32.000647 | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.nonIdAuthor | Joo, Ki-Nam | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | LOW-COHERENCE INTERFEROMETRY | - |
dc.subject.keywordPlus | THICKNESS | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.