Paired gap states in a semiconducting carbon nanotube: Deep and shallow levels

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dc.contributor.authorLee, Sko
dc.contributor.authorKim, Gko
dc.contributor.authorKim, Hko
dc.contributor.authorChoi, BYko
dc.contributor.authorLee, Jhinhwanko
dc.contributor.authorJeong, BWko
dc.contributor.authorIhm, Jko
dc.contributor.authorKuk, Yko
dc.contributor.authorKahng, SJko
dc.date.accessioned2013-03-06T11:13:46Z-
dc.date.available2013-03-06T11:13:46Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2005-10-
dc.identifier.citationPHYSICAL REVIEW LETTERS, v.95, no.16-
dc.identifier.issn0031-9007-
dc.identifier.urihttp://hdl.handle.net/10203/86784-
dc.description.abstractSeveral paired, localized gap states were observed in semiconducting single-wall carbon nanotubes using spatially resolved scanning tunneling spectroscopy. A pair of gap states is found far from the band edges, forming deep levels, while the other pair is located near the band edges, forming shallow levels. With the help of a first-principles study, the former is explained by a vacancy-adatom complex while the latter is explained by a pentagon-heptagon structure. Our experimental observation indicates that the presence of the gap states provides a means to perform local band-gap engineering as well as doping without impurity substitution.-
dc.languageEnglish-
dc.publisherAMERICAN PHYSICAL SOC-
dc.subjectSCANNING TUNNELING SPECTROSCOPY-
dc.subjectINTRAMOLECULAR JUNCTIONS-
dc.subjectDEFECTS-
dc.subjectVACANCIES-
dc.titlePaired gap states in a semiconducting carbon nanotube: Deep and shallow levels-
dc.typeArticle-
dc.identifier.wosid000232558400053-
dc.identifier.scopusid2-s2.0-28844459495-
dc.type.rimsART-
dc.citation.volume95-
dc.citation.issue16-
dc.citation.publicationnamePHYSICAL REVIEW LETTERS-
dc.identifier.doi10.1103/PhysRevLett.95.166402-
dc.contributor.localauthorLee, Jhinhwan-
dc.contributor.nonIdAuthorLee, S-
dc.contributor.nonIdAuthorKim, G-
dc.contributor.nonIdAuthorKim, H-
dc.contributor.nonIdAuthorChoi, BY-
dc.contributor.nonIdAuthorJeong, BW-
dc.contributor.nonIdAuthorIhm, J-
dc.contributor.nonIdAuthorKuk, Y-
dc.contributor.nonIdAuthorKahng, SJ-
dc.type.journalArticleArticle-
dc.subject.keywordPlusSCANNING TUNNELING SPECTROSCOPY-
dc.subject.keywordPlusINTRAMOLECULAR JUNCTIONS-
dc.subject.keywordPlusDEFECTS-
dc.subject.keywordPlusVACANCIES-
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