DC Field | Value | Language |
---|---|---|
dc.contributor.author | Han, SH | ko |
dc.contributor.author | Kweon, In-So | ko |
dc.date.accessioned | 2013-03-04T02:54:40Z | - |
dc.date.available | 2013-03-04T02:54:40Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2003-10 | - |
dc.identifier.citation | ELECTRONICS LETTERS, v.39, pp.1579 - 1581 | - |
dc.identifier.issn | 0013-5194 | - |
dc.identifier.uri | http://hdl.handle.net/10203/81623 | - |
dc.description.abstract | A reliable detection method for cuts and dissolves by linear regression analysis of temporal block differences is presented. Scene-dependent problems, i.e. false detection induced by large motion, and missed detection of dissolves that involve low variance (or monochrome) frames and motion, are addressed. | - |
dc.language | English | - |
dc.publisher | INST ENGINEERING TECHNOLOGY-IET | - |
dc.title | Detecting cuts and dissolves through linear regression analysis | - |
dc.type | Article | - |
dc.identifier.wosid | 000186629500014 | - |
dc.identifier.scopusid | 2-s2.0-0242552319 | - |
dc.type.rims | ART | - |
dc.citation.volume | 39 | - |
dc.citation.beginningpage | 1579 | - |
dc.citation.endingpage | 1581 | - |
dc.citation.publicationname | ELECTRONICS LETTERS | - |
dc.contributor.localauthor | Kweon, In-So | - |
dc.contributor.nonIdAuthor | Han, SH | - |
dc.type.journalArticle | Article | - |
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