Spin-Containing Defects and Conductivity in Hydrogenated Nanocrystalline Silicon Carbon Doped Films
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lim, Koeng Su | ko |
| dc.date.accessioned | 2013-03-04T02:14:55Z | - |
| dc.date.available | 2013-03-04T02:14:55Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2004-05 | - |
| dc.identifier.citation | PHYSICS AND TECHNOLOGY OF SEMICONDUCTORS, v.38, no.5, pp.547 - 549 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/81454 | - |
| dc.language | English | - |
| dc.publisher | Ioffe | - |
| dc.title | Spin-Containing Defects and Conductivity in Hydrogenated Nanocrystalline Silicon Carbon Doped Films | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 38 | - |
| dc.citation.issue | 5 | - |
| dc.citation.beginningpage | 547 | - |
| dc.citation.endingpage | 549 | - |
| dc.citation.publicationname | PHYSICS AND TECHNOLOGY OF SEMICONDUCTORS | - |
| dc.contributor.localauthor | Lim, Koeng Su | - |
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