Anomalous thermopower of a quasi-two-dimensional low-density metallic hole gas

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We study the thermopower S and the resistance R of a low-density quasi-two-dimensional hole gas in the metallic regime at low temperatures (T's). Long-range interface-roughness fluctuations are found to explain the sign anomaly and the sign reversal of the recently observed T-dependent S. Two mechanisms showing similar S(R) can yield very different R(S), indicating that S and R play a complementary role toward understanding the transport mechanism.
Publisher
AMERICAN PHYSICAL SOC
Issue Date
2004
Language
English
Article Type
Article
Keywords

INTERFACE-ROUGHNESS SCATTERING; SILICON INVERSION-LAYERS; TWO-DIMENSIONAL SYSTEMS; TEMPERATURE-DEPENDENCE; INSULATOR-TRANSITION; IMPURITY-SCATTERING; SCALING THEORY; ELECTRON-GAS; V COMPOUNDS; SI-MOSFET

Citation

PHYSICAL REVIEW B, v.70, no.15

ISSN
1098-0121
DOI
10.1103/PhysRevB.70.153301
URI
http://hdl.handle.net/10203/81310
Appears in Collection
RIMS Journal Papers
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