Small signal and power measurements of AlGaN/GaN HEMT with SiN passivation

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dc.contributor.authorjong-soo leeko
dc.contributor.authora. vescanko
dc.contributor.authora. wiesztko
dc.contributor.authorr. dietrichko
dc.contributor.authorh. leierko
dc.contributor.authorKwon, Young Seko
dc.date.accessioned2013-03-04T00:30:13Z-
dc.date.available2013-03-04T00:30:13Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2001-01-
dc.identifier.citationELECTRONICS LETTERS, v.37, no.2, pp.130 - 132-
dc.identifier.issn0013-5194-
dc.identifier.urihttp://hdl.handle.net/10203/81089-
dc.description.abstractSmall signal S-parameters and loadpull measurements are reported for AlGaN/GaN HEMT devices with 200nm SiN passivation. The maximum output power increases from 0.59W/ mm to 1.45W/mm and the efficiency is also enhanced from 16 to 27% for 2x50 mum HEMT devices after SiN passivation. Small signal equivalent circuit parameters including parasitic and intrinsic ones have been extracted from the measured S-parameters and are used to explain the effect of SSI on the power characteristics.-
dc.languageEnglish-
dc.publisherInst Engineering Technology-Iet-
dc.subjectEQUIVALENT-CIRCUIT-
dc.titleSmall signal and power measurements of AlGaN/GaN HEMT with SiN passivation-
dc.typeArticle-
dc.identifier.wosid000166791300040-
dc.identifier.scopusid2-s2.0-0035131801-
dc.type.rimsART-
dc.citation.volume37-
dc.citation.issue2-
dc.citation.beginningpage130-
dc.citation.endingpage132-
dc.citation.publicationnameELECTRONICS LETTERS-
dc.contributor.localauthorKwon, Young Se-
dc.contributor.nonIdAuthorjong-soo lee-
dc.contributor.nonIdAuthora. vescan-
dc.contributor.nonIdAuthora. wieszt-
dc.contributor.nonIdAuthorr. dietrich-
dc.contributor.nonIdAuthorh. leier-
dc.type.journalArticleArticle-
dc.subject.keywordPlusEQUIVALENT-CIRCUIT-
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