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An effective and efficient defect inspection system for TFT-LCD polarised films using adaptive thresholds and shape-based image analyses

Noh, Chung-Ho; Lee, Seok-Lyong; Kim, Deok-Hwan; Chung, Chin-Wan; Kim, Sang-Hee, INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, v.48, no.17, pp.5115 - 5135, 2010

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