Browse "School of Computing(전산학부)" by Subject UNCERTAINTY
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| Measuring Color Defects in Flat Panel Displays Using HDR Imaging and Appearance Modeling NAM, Giljoo; Lee, Haebom; Oh, Sungsoo; Kim, Min Hyuk, IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.65, no.2, pp.297 - 304, 2016-02 |
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