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Efficient Learning of Image Super-Resolution and Compression Artifact Removal with Semi-Local Gaussian Processes Kwon, Younghee; Kim, Kwang In; Tompkin, James; Kim, Jin Hyung; Theobalt, Christian, IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, v.37, no.9, pp.1792 - 1805, 2015-09 |
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