Browse "School of Computing(전산학부)" by Author Yi, Jooyong
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Extending Developer Experience Metrics for Better Effort-Aware Just-In-Time Defect Prediction Cho, Yeongjun; Kwon, Jung-Hyun; Yi, Jooyong; Ko, In-Young, IEEE ACCESS, v.10, pp.128218 - 128231, 2022-12 |
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