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Exact Scalable Sensitivity Analysis for the Next Release Problem Harman, Mark; Krinke, Jens; Medina-Bulo, Inmaculada; Palomo-Lozano, Francisco; Ren, Jian; Yoo, Shin, ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, v.23, no.2, 2014-03 |
Search based data sensitivity analysis applied to requirement engineering Harman, Mark; Krinke, Jens; Ren, Jian; Yoo, Shin, 11th Annual Genetic and Evolutionary Computation Conference, GECCO-2009, pp.1681 - 1688, ACM SIGEVO, 2009-07-10 |
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