Browse "School of Computing(전산학부)" by Author Lee, Soo-In
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| Automatic Test Case Generation Using Multi-protocol Test Method Lee, Soo-In; Park, Yongbum; Youn, Hee Yong; Kim, Myungchul; Lee, Ben, IEEE Ninth International Conference on Computer Communications and Networks, pp.360 - 366, IEEE, 2000 |
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