Browse "School of Computing(전산학부)" by Author Baek, Junki
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| Concolic Testing for High Test Coverage and Reduced Human Effort in Automotive Industry Kim, Yunho; Lee, Dongju; Baek, Junki; Kim, Moonzoo, International Conference on Software Engineering (ICSE), pp.151 - 160, IEEE Computer Society and ACM SIGSOFT, 2019-05-29 |
| MAESTRO: Automated test generation framework for high test coverage and reduced human effort in automotive industry Kim, Yunho; Lee, Dongju; Baek, Junki; Kim, Moonzoo, INFORMATION AND SOFTWARE TECHNOLOGY, v.123, 2020-07 |
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