Browse "School of Computing(전산학부)" by Author Yoo, Shin
Showing results 101 to 109 of 109
| Test data regeneration: generating new test data from existing test data Yoo, Shin; Harman, M., SOFTWARE TESTING VERIFICATION & RELIABILITY, v.22, no.3, pp.171 - 201, 2012-05 |
| Test Set Diameter: Quantifying the Diversity of Sets of Test Cases Feldt, Robert; Poulding, Simon; Clark, David; Yoo, Shin, 9th IEEE International Conference on Software Testing, Verification and Validation, ICST 2016, pp.223 - 233, Institute of Electrical and Electronics Engineers Inc., 2016-04-14 |
| The Inversive Relationship Between Bugs and Patches: An Empirical Study Kim, Jinhan; Park, Jongchan; Yoo, Shin, 2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW), IEEE, 2023-04 |
| The Oracle Problem in Software Testing: A Survey Barr, Earl T.; McMinn, Phil; Shahbaz, Muzammil; Harman, Mark; Yoo, Shin, IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, v.41, no.5, pp.507 - 525, 2015-05 |
| Towards Objective-Tailored Genetic Improvement Through Large Language Models Kang, Sungmin; Yoo, Shin, 12th International Workshop on Genetic Improvement, University of Melbourne, 2023-05-20 |
| Tree-oriented vs. line-oriented observation-based slicing Binkley, Dave; Gold, Nicolas; Islam, Syed; Krinke, Jens; Yoo, Shin, Source Code Analysis and Manipulation (SCAM), IEEE COMPUTER SOC, 2017-09-17 |
| Using hybrid algorithm for Pareto efficient multi-objective test suite minimisation Yoo, Shin; Harman, Mark, JOURNAL OF SYSTEMS AND SOFTWARE, v.83, no.4, pp.689 - 701, 2010-04 |
| Using source code metrics to improve fault localization = 소스코드 메트릭 사용을 통한 결함 위치추정 성능 향상link Sohn, Jeongju; Yoo, Shin; et al, 한국과학기술원, 2017 |
| Why train-and-select when you can use them all? ensemble model for fault localisation Sohn, Jeongju; Yoo, Shin, the Genetic and Evolutionary Computation Conference, pp.1408 - 1416, ACM Press, 2019-07-15 |
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