Browse "School of Computing(전산학부)" by Author Yoo, Shin
Showing results 86 to 109 of 109
| Reducing DNN labelling cost using surprise adequacy: an industrial case study for autonomous driving Kim, Jinhan; Ju, Jeongil; Feldt, Robert; Yoo, Shin, ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, pp.1466 - 1476, ACM SIGSOFT, 2020-11-10 |
| Reducing the search space of bug inducing commits using failure coverage An, Gabin; Yoo, Shin, European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2021), pp.1459 - 1462, ACM, 2021-08-25 |
| Regression testing minimization, selection and prioritization: a survey Yoo, Shin; Harman, M., SOFTWARE TESTING VERIFICATION & RELIABILITY, v.22, no.2, pp.67 - 120, 2012-03 |
| Repairing DNN Architecture: Are We There Yet? Kim, Jinhan; Humbatova, Nargiz; Jahangirova, Gunel; Tonella, Paolo; Yoo, Shin, 2023 IEEE Conference on Software Testing, Verification and Validation (ICST), IEEE, 2023-04 |
| Repairing Fragile GUI Test Cases Using Word and Layout Embedding Yoon, Juyeon; Chung, Seungjoon; Shin, Kihyuck; Kim, Jinhan; Hong, Shin; Yoo, Shin, International Conference on Software Testing, Verification and Validation, ICST 2022, pp.291 - 301, Institute of Electrical and Electronics Engineers Inc., 2022-04-07 |
| SBST in the age of Machine Learning Systems - Challenges Ahead Yoo, Shin, IEEE/ACM 12th International Workshop on Search-Based Software Testing (SBST), pp.2, ASSOC COMPUTING MACHINERY, 2019-05-27 |
| Search based data sensitivity analysis applied to requirement engineering Harman, Mark; Krinke, Jens; Ren, Jian; Yoo, Shin, 11th Annual Genetic and Evolutionary Computation Conference, GECCO-2009, pp.1681 - 1688, ACM SIGEVO, 2009-07-10 |
| Search Based Software Engineering - Evolving Human Competitive Spectra-Based Fault Localisation Techniques Yoo, Shin, Lecture Notes in Computer Science, v.7515, pp.244 - 258, 2012 |
| Search-Based Approaches for Software Module Clustering Based on Multiple Relationship Factors Hwa, Jimin; Yoo, Shin; Seo, Yeong-Seok; Bae, Doo-Hwan, INTERNATIONAL JOURNAL OF SOFTWARE ENGINEERING AND KNOWLEDGE ENGINEERING, v.27, no.7, pp.1033 - 1062, 2017-09 |
| Searching for Multi-fault Programs in Defects4J An, Gabin; Yoon, Juyeon; Yoo, Shin, 13th International Symposium on Search Based Software Engineering, SSBSE 2021, pp.153 - 158, Springer International Publishing, 2021-10-11 |
| Seeing is slicing: Observation based slicing of picture description languages Yoo, Shin; Binkley, David; Eastman, Roger, 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014, pp.175 - 184, Institute of Electrical and Electronics Engineers Inc., 2014-09-29 |
| Selecting test inputs for DNNs using differential testing with subspecialized model instances Ma, Yu-Seung; Yoo, Shin; Kim, Taeho, 29th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/FSE '21, pp.1467 - 1470, ACM, 2021-08 |
| SINVAD: Search-based Image Space Navigation for DNN Image Classifier Test Input Generation Kang, Sungmin; Feldt, Robert; Yoo, Shin, 42nd IEEE/ACM International Conference on Software Engineering Workshops, ICSEW 2020, Association for Computing Machinery, Inc, 2020-06-27 |
| Statistical program dependence approximation = 통계적 프로그램 의존성 분석link Lee, Seongmin; Yoo, Shin; et al, 한국과학기술원, 2022 |
| Synergetic interaction between fault localisation and defect prediction = 결함 위치 식별과 결함 예측간의 보완적 상호작용link Sohn, Jeongju; Yoo, Shin; et al, 한국과학기술원, 2021 |
| Test data regeneration: generating new test data from existing test data Yoo, Shin; Harman, M., SOFTWARE TESTING VERIFICATION & RELIABILITY, v.22, no.3, pp.171 - 201, 2012-05 |
| Test Set Diameter: Quantifying the Diversity of Sets of Test Cases Feldt, Robert; Poulding, Simon; Clark, David; Yoo, Shin, 9th IEEE International Conference on Software Testing, Verification and Validation, ICST 2016, pp.223 - 233, Institute of Electrical and Electronics Engineers Inc., 2016-04-14 |
| The Inversive Relationship Between Bugs and Patches: An Empirical Study Kim, Jinhan; Park, Jongchan; Yoo, Shin, 2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW), IEEE, 2023-04 |
| The Oracle Problem in Software Testing: A Survey Barr, Earl T.; McMinn, Phil; Shahbaz, Muzammil; Harman, Mark; Yoo, Shin, IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, v.41, no.5, pp.507 - 525, 2015-05 |
| Towards Objective-Tailored Genetic Improvement Through Large Language Models Kang, Sungmin; Yoo, Shin, 12th International Workshop on Genetic Improvement, University of Melbourne, 2023-05-20 |
| Tree-oriented vs. line-oriented observation-based slicing Binkley, Dave; Gold, Nicolas; Islam, Syed; Krinke, Jens; Yoo, Shin, Source Code Analysis and Manipulation (SCAM), IEEE COMPUTER SOC, 2017-09-17 |
| Using hybrid algorithm for Pareto efficient multi-objective test suite minimisation Yoo, Shin; Harman, Mark, JOURNAL OF SYSTEMS AND SOFTWARE, v.83, no.4, pp.689 - 701, 2010-04 |
| Using source code metrics to improve fault localization = 소스코드 메트릭 사용을 통한 결함 위치추정 성능 향상link Sohn, Jeongju; Yoo, Shin; et al, 한국과학기술원, 2017 |
| Why train-and-select when you can use them all? ensemble model for fault localisation Sohn, Jeongju; Yoo, Shin, the Genetic and Evolutionary Computation Conference, pp.1408 - 1416, ACM Press, 2019-07-15 |
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