Showing results 7 to 10 of 10
Learning test-mutant relationship for accurate fault localisation Kim, Jinhan; An, Gabin; Feldt, Robert; Yoo, Shin, INFORMATION AND SOFTWARE TECHNOLOGY, v.162, 2023-10 |
Localising software faults by learning patterns of failing executions = 실행 오류 패턴 학습을 통한 소프트웨어 결함 위치 식별 기술link An, Gabin; Yoo, Shin; et al, 한국과학기술원, 2020 |
Reducing the search space of bug inducing commits using failure coverage An, Gabin; Yoo, Shin, European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2021), pp.1459 - 1462, ACM, 2021-08-25 |
Searching for Multi-fault Programs in Defects4J An, Gabin; Yoon, Juyeon; Yoo, Shin, 13th International Symposium on Search Based Software Engineering, SSBSE 2021, pp.153 - 158, Springer International Publishing, 2021-10-11 |
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