Browse "School of Computing(전산학부)" by Author Yoo, Shin
Showing results 46 to 105 of 109
| Generalized Observational Slicing for Tree-Represented Modelling Languages Gold, Nicolas E.; Binkley, David; Harman, Mark; Islam, Syed; Krinke, Jens; Yoo, Shin, 11th Joint Meeting of European Software Engineering Conference (ESEC) / ACM SIGSOFT Symposium on the Foundations of Software Engineering (FSE), pp.547 - 558, ACM Special Interest Group on Software Engineering (SIGSOFT), 2017-09-08 |
| Generating test input with deep reinforcement learning Kim, Junhwi; Kwon, Minhyuk; Yoo, Shin, 11th ACM/IEEE International Workshop on Search-Based Software Testing, SBST 2018, co-located with the 40th International Conference on Software Engineering, ICSE 2018, pp.51 - 58, IEEE Computer Society, 2018-05-29 |
| Generating test input with deep reinforcement learning = 강화학습을 활용한 테스트입력 생성기법link Kim, Junhwi; Yoo, Shin; et al, 한국과학기술원, 2018 |
| GPGPGPU: Evaluation of parallelisation of genetic programming using GPGPU Kim, Jinhan; Kim, Junhwi; Yoo, Shin, 9th International Symposium on Search-Based Software Engineering, SSBSE 2017, pp.137 - 142, Springer Verlag, 2017-09-10 |
| GPGPU test suite minimisation: search based software engineering performance improvement using graphics cards Yoo, Shin; Harman, Mark; Ur, Shmuel, EMPIRICAL SOFTWARE ENGINEERING, v.18, no.3, pp.550 - 593, 2013-06 |
| Guest editorial for special section on research in search-based software engineering Le Goues, Claire; Yoo, Shin, EMPIRICAL SOFTWARE ENGINEERING, v.22, no.2, pp.849 - 851, 2017-04 |
| Guiding Deep Learning System Testing Using Surprise Adequacy Kim, Jinhan; Feldt, Robert; Yoo, Shin, 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), pp.1039 - 1049, IEEE, 2019-05-31 |
| Highly scalable multi objective test suite minimisation using graphics cards Yoo, Shin; Harman, Mark; Ur, Shmuel, 3rd International Symposium on Search-Based Software Engineering, SSBSE 2011, pp.219 - 236, University of Szeged, 2011-09-12 |
| Human Competitiveness of Genetic Programming in Spectrum-Based Fault Localisation: Theoretical and Empirical Analysis Yoo, Shin; Xie, Xiaoyuan; Kuo, Fei-Ching; Chen, Tsonng Yueh; Harman, Mark, ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, v.26, no.1, 2017-07 |
| Hyperheuristic observation based slicing of guava Lee, Seongmin; Yoo, Shin, 9th International Symposium on Search-Based Software Engineering, SSBSE 2017, pp.175 - 180, Springer Verlag, 2017-09-09 |
| Improving search based test data generation using multi directional search = 다방향 탐색을 통한 검색 기반 테스트 데이터 생성 개선link You, Byeonghyeon; Yoo, Shin; et al, 한국과학기술원, 2018 |
| Inferring automatic test oracles Langdon, William B.; Yoo, Shin; Harman, Mark, 10th IEEE/ACM International Workshop on Search-Based Software Testing, SBST 2017, pp.5 - 6, Institute of Electrical and Electronics Engineers Inc., 2017-05 |
| Information transformation: An underpinning theory for software engineering Clark, David; Feldt, Robert; Poulding, Simon; Yoo, Shin, International Conference on Software Engineering, pp.599 - 602, IEEE Computer Society and ACM SIGSOFT, 2015-05-20 |
| Language Models Can Prioritize Patches for Practical Program Patching Kang, Sungmin; Yoo, Shin, 3rd IEEE/ACM International Workshop on Automated Program Repair, APR 2022, pp.8 - 15, Institute of Electrical and Electronics Engineers Inc., 2022-05-19 |
| Large Language Models are Few-shot Testers: Exploring LLM-based General Bug Reproduction Kang, Sungmin; Yoon, Juyeon; Yoo, Shin, 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE), IEEE, 2023-05-17 |
| Learning fault localisation for both humans and machines using multi-objective GP Choi, Kabdo; Sohn, Jeongju; Yoo, Shin, 10th International Symposium on Search-Based Software Engineering, SSBSE 2018, pp.349 - 355, Springer Verlag, 2018-09-09 |
| Learning test-mutant relationship for accurate fault localisation Kim, Jinhan; An, Gabin; Feldt, Robert; Yoo, Shin, INFORMATION AND SOFTWARE TECHNOLOGY, v.162, 2023-10 |
| Learning without peeking: Secure multi-party computation genetic programming Kim, Jinhan; Epitropakis, Michael G.; Yoo, Shin, 10th International Symposium on Search-Based Software Engineering, SSBSE 2018, pp.246 - 261, Springer Verlag, 2018-09-09 |
| Leveraging Fault Localisation to Enhance Defect Prediction Sohn, Jeongju; Kamei, Yasutaka; McIntosh, Shane; Yoo, Shin, 28th IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER), pp.284 - 294, IEEE COMPUTER SOC, 2021-03-11 |
| Localising software faults by learning patterns of failing executions = 실행 오류 패턴 학습을 통한 소프트웨어 결함 위치 식별 기술link An, Gabin; Yoo, Shin; et al, 한국과학기술원, 2020 |
| Measuring and improving latency to avoid test suite wear out Yoo, Shin; Harman, Mark; Ur, Shmuel, IEEE International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2009, pp.101 - 110, Institute of Electrical and Electronics Engineers Inc., 2009-04-01 |
| Metamorphic testing of stochastic optimisation Yoo, Shin, 3rd International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2010, pp.192 - 201, University of Nebraska Lincoln, 2010-04-06 |
| Method invocation guided GUI testing of android applications = 메소드 호출 정보를 이용한 안드로이드 앱 GUI 테스팅link Lee, Seonghoi; Yoo, Shin; et al, 한국과학기술원, 2020 |
| Mining Fix Patterns for FindBugs Violations Liu, Kui; Kim, Dongsun; Bissyande, Tegawende F.; Yoo, Shin; Le Traon, Yves, IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, v.47, no.1, pp.165 - 188, 2021-01 |
| MOAD: Modeling Observation-based Approximate Dependency Lee, Seongmin; Binkley, David; Feldt, Robert; Gold, Nicolas; Yoo, Shin, IEEE International Conference on Source Code Analysis and Manipulation, pp.12 - 22, IEEE Computer Society, 2019-09-30 |
| MOBS: Multi-Operator Observation-Based Slicing using Lexical Approximation of Program Dependence Lee, Seongmin; Binkley, David; Gold, Nicolas; Islam, Syed; Krinke, Jens; Yoo, Shin, 40th ACM/IEEE International Conference on Software Engineering (ICSE), pp.302 - 303, IEEE, 2018-05-30 |
| Multimodal Surprise Adequacy Analysis of Inputs for Natural Language Processing DNN Models Kim, Seah; Yoo, Shin, 2nd IEEE/ACM International Conference on Automation of Software Test (AST), pp.80 - 89, IEEE COMPUTER SOC, 2021-05-21 |
| Observation-based approximate dependency modeling and its use for program slicing Lee, Seongmin; Binkley, David; Feldt, Robert; Gold, Nicolas; Yoo, Shin, JOURNAL OF SYSTEMS AND SOFTWARE, v.179, pp.110988, 2021-09 |
| Observational slicing based on visual semantics Yoo, Shin; Binkley, David; Eastman, Roger, JOURNAL OF SYSTEMS AND SOFTWARE, v.129, pp.60 - 78, 2017-07 |
| Optimizing for the number of tests generated in search based test data generation with an application to the oracle cost problem Harman, Mark; Kim, Sung Gon; Lakhotia, Kiran; McMinn, Phil; Yoo, Shin, 3rd International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2010, pp.182 - 191, University of Nebraska Lincoln, 2010-04-06 |
| ORBS and the limits of static slicing Binkley, David; Gold, Nicolas; Harman, Mark; Islam, Syed; Krinke, Jens; Yoo, Shin, IEEE 15th International Working Conference on Source Code Analysis and Manipulation, SCAM 2015, pp.1 - 10, Institute of Electrical and Electronics Engineers Inc., 2015-09-27 |
| ORBS: Language-independent program slicing Binkle, David; Gold, Nicolas; Harman, Mark; Islam, Syed; Krinke, Jens; Yoo, Shin, 22nd ACM SIGSOFT International Symposium on the Foundations of Software Engineering, FSE 2014, pp.109 - 120, ACM Special Interest Group on Software Engineering (SIGSOFT), 2014-11-19 |
Pandemic programming How COVID-19 affects software developers and how their organizations can help Ralph, Paul; Baltes, Sebastian; Adisaputri, Gianisa; Torkar, Richard; Kovalenko, Vladimir; Kalinowski, Marcos; Novielli, Nicole; et al, EMPIRICAL SOFTWARE ENGINEERING, v.25, no.6, pp.4927 - 4961, 2020-11 |
| Pareto efficient multi-objective test case selection Yoo, Shin; Harman, Mark, 2007 ACM International Symposium on Software Testing and Analysis, ISSTA'07 and PADTAD-V Workshop, pp.140 - 150, ACM Special Interest Group on Software Engineering (SIGSOFT), 2007-07-11 |
| Practical Combinatorial Interaction Testing: Empirical Findings on Efficiency and Early Fault Detection Petke, Justyna; Cohen, Myra B.; Harman, Mark; Yoo, Shin, IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, v.41, no.9, pp.901 - 924, 2015-09 |
| Precise Learn-to-Rank Fault Localization Using Dynamic and Static Features of Target Programs Kim, Yunho; Mun, Seokhyun; Yoo, Shin; Kim, Moonzoo, ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, v.28, no.4, pp.1 - 34, 2019-10 |
| Predictive Mutation Analysis via the Natural Language Channel in Source Code Kim, Jinhan; Jeon, Juyoung; Hong, Shin; Yoo, Shin, ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, v.31, no.4, pp.1 - 27, 2022-10 |
| Preliminary Evaluation of SWAY in Permutation Decision Space via a Novel Euclidean Embedding Lee, Junghyun; Jung, Chani; Yoo, Shin; Lee, Dongmin; Yoon, Juyeon; Park, Yoo Hwa, 13th International Symposium on Search Based Software Engineering, pp.26 - 40, Springer International Publishing, 2021-10-12 |
| Provably optimal and human-competitive results in SBSE for spectrum based fault localisation Xie, Xiaoyuan; Kuo, Fei-Ching; Chen, Tsong Yueh; Yoo, Shin; Harman, Mark, 5th International Symposium on Search-Based Software Engineering, SSBSE 2013, pp.224 - 238, University of St. Petersburg, 2013-08-25 |
| PyGGI 2.0: language independent genetic improvement framework 안가빈; Blot, Aymeric; Petke, Justyna; Yoo, Shin, the 2019 27th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering - ESEC/FSE 2019, pp.1100 - 1104, ACM Press, 2019-08-29 |
| Reducing DNN labelling cost using surprise adequacy: an industrial case study for autonomous driving Kim, Jinhan; Ju, Jeongil; Feldt, Robert; Yoo, Shin, ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, pp.1466 - 1476, ACM SIGSOFT, 2020-11-10 |
| Reducing the search space of bug inducing commits using failure coverage An, Gabin; Yoo, Shin, European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2021), pp.1459 - 1462, ACM, 2021-08-25 |
| Regression testing minimization, selection and prioritization: a survey Yoo, Shin; Harman, M., SOFTWARE TESTING VERIFICATION & RELIABILITY, v.22, no.2, pp.67 - 120, 2012-03 |
| Repairing DNN Architecture: Are We There Yet? Kim, Jinhan; Humbatova, Nargiz; Jahangirova, Gunel; Tonella, Paolo; Yoo, Shin, 2023 IEEE Conference on Software Testing, Verification and Validation (ICST), IEEE, 2023-04 |
| Repairing Fragile GUI Test Cases Using Word and Layout Embedding Yoon, Juyeon; Chung, Seungjoon; Shin, Kihyuck; Kim, Jinhan; Hong, Shin; Yoo, Shin, International Conference on Software Testing, Verification and Validation, ICST 2022, pp.291 - 301, Institute of Electrical and Electronics Engineers Inc., 2022-04-07 |
| SBST in the age of Machine Learning Systems - Challenges Ahead Yoo, Shin, IEEE/ACM 12th International Workshop on Search-Based Software Testing (SBST), pp.2, ASSOC COMPUTING MACHINERY, 2019-05-27 |
| Search based data sensitivity analysis applied to requirement engineering Harman, Mark; Krinke, Jens; Ren, Jian; Yoo, Shin, 11th Annual Genetic and Evolutionary Computation Conference, GECCO-2009, pp.1681 - 1688, ACM SIGEVO, 2009-07-10 |
| Search Based Software Engineering - Evolving Human Competitive Spectra-Based Fault Localisation Techniques Yoo, Shin, Lecture Notes in Computer Science, v.7515, pp.244 - 258, 2012 |
| Search-Based Approaches for Software Module Clustering Based on Multiple Relationship Factors Hwa, Jimin; Yoo, Shin; Seo, Yeong-Seok; Bae, Doo-Hwan, INTERNATIONAL JOURNAL OF SOFTWARE ENGINEERING AND KNOWLEDGE ENGINEERING, v.27, no.7, pp.1033 - 1062, 2017-09 |
| Searching for Multi-fault Programs in Defects4J An, Gabin; Yoon, Juyeon; Yoo, Shin, 13th International Symposium on Search Based Software Engineering, SSBSE 2021, pp.153 - 158, Springer International Publishing, 2021-10-11 |
| Seeing is slicing: Observation based slicing of picture description languages Yoo, Shin; Binkley, David; Eastman, Roger, 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014, pp.175 - 184, Institute of Electrical and Electronics Engineers Inc., 2014-09-29 |
| Selecting test inputs for DNNs using differential testing with subspecialized model instances Ma, Yu-Seung; Yoo, Shin; Kim, Taeho, 29th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/FSE '21, pp.1467 - 1470, ACM, 2021-08 |
| SINVAD: Search-based Image Space Navigation for DNN Image Classifier Test Input Generation Kang, Sungmin; Feldt, Robert; Yoo, Shin, 42nd IEEE/ACM International Conference on Software Engineering Workshops, ICSEW 2020, Association for Computing Machinery, Inc, 2020-06-27 |
| Statistical program dependence approximation = 통계적 프로그램 의존성 분석link Lee, Seongmin; Yoo, Shin; et al, 한국과학기술원, 2022 |
| Synergetic interaction between fault localisation and defect prediction = 결함 위치 식별과 결함 예측간의 보완적 상호작용link Sohn, Jeongju; Yoo, Shin; et al, 한국과학기술원, 2021 |
| Test data regeneration: generating new test data from existing test data Yoo, Shin; Harman, M., SOFTWARE TESTING VERIFICATION & RELIABILITY, v.22, no.3, pp.171 - 201, 2012-05 |
| Test Set Diameter: Quantifying the Diversity of Sets of Test Cases Feldt, Robert; Poulding, Simon; Clark, David; Yoo, Shin, 9th IEEE International Conference on Software Testing, Verification and Validation, ICST 2016, pp.223 - 233, Institute of Electrical and Electronics Engineers Inc., 2016-04-14 |
| The Inversive Relationship Between Bugs and Patches: An Empirical Study Kim, Jinhan; Park, Jongchan; Yoo, Shin, 2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW), IEEE, 2023-04 |
| The Oracle Problem in Software Testing: A Survey Barr, Earl T.; McMinn, Phil; Shahbaz, Muzammil; Harman, Mark; Yoo, Shin, IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, v.41, no.5, pp.507 - 525, 2015-05 |
| Towards Objective-Tailored Genetic Improvement Through Large Language Models Kang, Sungmin; Yoo, Shin, 12th International Workshop on Genetic Improvement, University of Melbourne, 2023-05-20 |
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