Browse "School of Computing(전산학부)" by Author Yoo, Shin
Showing results 22 to 81 of 109
| Effectively Sampling Higher Order Mutants Using Causal Effect Oh, Saeyoon; Lee, Seongmin; Yoo, Shin, 14th IEEE Conference on Software Testing, Verification and Validation (ICST), pp.19 - 24, IEEE COMPUTER SOC, 2021-04-12 |
| Efficiency and early fault detection with lower and higher strength combinatorial interaction testing Petke, Justyna; Yoo, Shin; Cohen, Myra B.; Harman, Mark, 2013 9th Joint Meeting of the European Software Engineering Conference and the ACM SIGSOFT Symposium on the Foundations of Software Engineering, ESEC/FSE 2013, pp.26 - 36, ACM Special Interest Group on Software Engineering (SIGSOFT), 2013-08-23 |
| Embedding genetic improvement into programming languages Yoo, Shin, 2017 Genetic and Evolutionary Computation Conference Companion, GECCO 2017, pp.1551 - 1552, Association for Computing Machinery, Inc, 2017-07 |
| Empirical Evaluation of Conditional Operators in GP Based Fault Localization Dahyun Kang; Sohn, Jeong Ju; Yoo, Shin, Genetic and Evolutionary Computation Conference (GECCO), pp.1295 - 1302, ACM SIGEVO, 2017-07-15 |
| Empirical Evaluation of Fault Localisation Using Code and Change Metrics Sohn, Joengju; Yoo, Shin, IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, v.47, no.8, pp.1605 - 1625, 2021-08 |
| Empirical evaluation of mutation-based test case prioritization techniques Shin, Donghwan; Yoo, Shin; Papadakis, Mike; Bae, Doo-Hwan, Software Testing, Verification and Reliability, v.29, no.1-2, pp.e1695, 2019-03 |
| Empirical evaluation of pareto efficient multi-objective regression test case prioritisation Epitropakis, Michael G; Yoo, Shin; Harman, Mark; Burke, Edmund K, International Symposium on Software Testing and Analysis, pp.234 - 245, ACM Special Interest Group on Software Engineering (SIGSOFT), 2015-07-16 |
| Empirical Software Engineering and Verification - Search Based Software Engineering: Techniques, Taxonomy, Tutorial Harman, Mark; McMinn, Phil; Teixeira de Souza, Jerffeson; Yoo, Shin, Lecture Notes in Computer Science, v.7007, 2012 |
| Enhancing lexical representation of test coverage for failure clustering = 다중 실행 오류 클러스터링을 위한 테스트 커버리지의 어휘적 표현 향상link Yoon, Juyeon; Yoo, Shin; et al, 한국과학기술원, 2022 |
| Enhancing Lexical Representation of Test Coverage for Failure Clustering Yoon, Juyeon; Yoo, Shin, 2021 36th IEEE/ACM International Conference on Automated Software Engineering Workshops (ASEW), pp.232 - 238, IEEE, 2021-11 |
| Evaluating CAVM: A new search-based test data generation tool for C Kim, Junhwi; You, Byeonghyeon; Kwon, Minhyuk; McMinn, Phil; Yoo, Shin, 9th International Symposium on Search-Based Software Engineering, SSBSE 2017, pp.143 - 149, Springer Verlag, 2017-09-11 |
| Evaluating Lexical Approximation of Program Dependence Lee, Seongmin; Binkley, David; Gold, Nicolas; Islam, Syed; Krinke, Jens; Yoo, Shin, JOURNAL OF SYSTEMS AND SOFTWARE, v.160, 2020-02 |
| Evaluating Surprise Adequacy for Deep Learning System Testing Kim, Jinhan; Feldt, Robert; Yoo, Shin, ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, v.32, no.2, 2023-04 |
| Evaluating Surprise Adequacy for Question Answering Kim, Seah; Yoo, Shin, 42nd IEEE/ACM International Conference on Software Engineering Workshops, ICSEW 2020, Association for Computing Machinery, Inc, 2020-06-27 |
| Evaluating surprise adequacy on natural language processing = 자연어 처리의 놀라움 적합도 평가link Kim, Seah; Yoo, Shin; et al, 한국과학기술원, 2020 |
| Evolving human competitive spectra-based fault localisation techniques Yoo, Shin, 4th International Symposium on Search Based Software Engineering, SSBSE 2012, pp.244 - 258, Fondazione Bruno Kessler, 2012-09-29 |
| Exact Scalable Sensitivity Analysis for the Next Release Problem Harman, Mark; Krinke, Jens; Medina-Bulo, Inmaculada; Palomo-Lozano, Francisco; Ren, Jian; Yoo, Shin, ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, v.23, no.2, 2014-03 |
| Exploiting mutant’s relationship with code, faults, and patches for higher efficacy of mutation analysis = 뮤테이션 기법의 효용성 향상을 위한 뮤턴트와 코드, 결함, 패치 사이의 관계 분석link Kim, Jinhan; Yoo, Shin; et al, 한국과학기술원, 2023 |
| Fault Localization Prioritization: Comparing Information-Theoretic and Coverage-Based Approaches Yoo, Shin; Harman, Mark; Clark, David, ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, v.22, no.3, 2013-07 |
| FDG: a precise measurement of fault diagnosability gain of test cases An, Gabin; Yoo, Shin, 31st ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA '22, pp.14 - 26, ACM, 2022-07-20 |
| Field report: Applying monte carlo tree search for program synthesis Lim, Jinsuk; Yoo, Shin, 8th International Symposium on Search Based Software Engineering, SSBSE 2016, pp.304 - 310, Springer Verlag, 2016-10 |
| Flexible Probabilistic Modeling for Search Based Test Data Generation Feldt, Robert; Yoo, Shin, ICSE '20: 42nd International Conference on Software Engineering, Association for Computing Machinery, Inc, 2020-06-27 |
| FLUCCS: Using Code and Change Metrics to Improve Fault Localization Sohn, Jeongju; Yoo, Shin, 26th ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA), pp.273 - 283, ACM Special Interest Group on Software Engineering (SIGSOFT), 2017-07-12 |
| Fonte: Finding Bug Inducing Commits from Failures An, Gabin; Yoo, Shin; Hong, Jingun; Kim, Naryeong, 45th International Conference on Software Engineering, IEEE/ACM, 2023-05-17 |
| Generalized Observational Slicing for Tree-Represented Modelling Languages Gold, Nicolas E.; Binkley, David; Harman, Mark; Islam, Syed; Krinke, Jens; Yoo, Shin, 11th Joint Meeting of European Software Engineering Conference (ESEC) / ACM SIGSOFT Symposium on the Foundations of Software Engineering (FSE), pp.547 - 558, ACM Special Interest Group on Software Engineering (SIGSOFT), 2017-09-08 |
| Generating test input with deep reinforcement learning Kim, Junhwi; Kwon, Minhyuk; Yoo, Shin, 11th ACM/IEEE International Workshop on Search-Based Software Testing, SBST 2018, co-located with the 40th International Conference on Software Engineering, ICSE 2018, pp.51 - 58, IEEE Computer Society, 2018-05-29 |
| Generating test input with deep reinforcement learning = 강화학습을 활용한 테스트입력 생성기법link Kim, Junhwi; Yoo, Shin; et al, 한국과학기술원, 2018 |
| GPGPGPU: Evaluation of parallelisation of genetic programming using GPGPU Kim, Jinhan; Kim, Junhwi; Yoo, Shin, 9th International Symposium on Search-Based Software Engineering, SSBSE 2017, pp.137 - 142, Springer Verlag, 2017-09-10 |
| GPGPU test suite minimisation: search based software engineering performance improvement using graphics cards Yoo, Shin; Harman, Mark; Ur, Shmuel, EMPIRICAL SOFTWARE ENGINEERING, v.18, no.3, pp.550 - 593, 2013-06 |
| Guest editorial for special section on research in search-based software engineering Le Goues, Claire; Yoo, Shin, EMPIRICAL SOFTWARE ENGINEERING, v.22, no.2, pp.849 - 851, 2017-04 |
| Guiding Deep Learning System Testing Using Surprise Adequacy Kim, Jinhan; Feldt, Robert; Yoo, Shin, 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), pp.1039 - 1049, IEEE, 2019-05-31 |
| Highly scalable multi objective test suite minimisation using graphics cards Yoo, Shin; Harman, Mark; Ur, Shmuel, 3rd International Symposium on Search-Based Software Engineering, SSBSE 2011, pp.219 - 236, University of Szeged, 2011-09-12 |
| Human Competitiveness of Genetic Programming in Spectrum-Based Fault Localisation: Theoretical and Empirical Analysis Yoo, Shin; Xie, Xiaoyuan; Kuo, Fei-Ching; Chen, Tsonng Yueh; Harman, Mark, ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, v.26, no.1, 2017-07 |
| Hyperheuristic observation based slicing of guava Lee, Seongmin; Yoo, Shin, 9th International Symposium on Search-Based Software Engineering, SSBSE 2017, pp.175 - 180, Springer Verlag, 2017-09-09 |
| Improving search based test data generation using multi directional search = 다방향 탐색을 통한 검색 기반 테스트 데이터 생성 개선link You, Byeonghyeon; Yoo, Shin; et al, 한국과학기술원, 2018 |
| Inferring automatic test oracles Langdon, William B.; Yoo, Shin; Harman, Mark, 10th IEEE/ACM International Workshop on Search-Based Software Testing, SBST 2017, pp.5 - 6, Institute of Electrical and Electronics Engineers Inc., 2017-05 |
| Information transformation: An underpinning theory for software engineering Clark, David; Feldt, Robert; Poulding, Simon; Yoo, Shin, International Conference on Software Engineering, pp.599 - 602, IEEE Computer Society and ACM SIGSOFT, 2015-05-20 |
| Language Models Can Prioritize Patches for Practical Program Patching Kang, Sungmin; Yoo, Shin, 3rd IEEE/ACM International Workshop on Automated Program Repair, APR 2022, pp.8 - 15, Institute of Electrical and Electronics Engineers Inc., 2022-05-19 |
| Large Language Models are Few-shot Testers: Exploring LLM-based General Bug Reproduction Kang, Sungmin; Yoon, Juyeon; Yoo, Shin, 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE), IEEE, 2023-05-17 |
| Learning fault localisation for both humans and machines using multi-objective GP Choi, Kabdo; Sohn, Jeongju; Yoo, Shin, 10th International Symposium on Search-Based Software Engineering, SSBSE 2018, pp.349 - 355, Springer Verlag, 2018-09-09 |
| Learning test-mutant relationship for accurate fault localisation Kim, Jinhan; An, Gabin; Feldt, Robert; Yoo, Shin, INFORMATION AND SOFTWARE TECHNOLOGY, v.162, 2023-10 |
| Learning without peeking: Secure multi-party computation genetic programming Kim, Jinhan; Epitropakis, Michael G.; Yoo, Shin, 10th International Symposium on Search-Based Software Engineering, SSBSE 2018, pp.246 - 261, Springer Verlag, 2018-09-09 |
| Leveraging Fault Localisation to Enhance Defect Prediction Sohn, Jeongju; Kamei, Yasutaka; McIntosh, Shane; Yoo, Shin, 28th IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER), pp.284 - 294, IEEE COMPUTER SOC, 2021-03-11 |
| Localising software faults by learning patterns of failing executions = 실행 오류 패턴 학습을 통한 소프트웨어 결함 위치 식별 기술link An, Gabin; Yoo, Shin; et al, 한국과학기술원, 2020 |
| Measuring and improving latency to avoid test suite wear out Yoo, Shin; Harman, Mark; Ur, Shmuel, IEEE International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2009, pp.101 - 110, Institute of Electrical and Electronics Engineers Inc., 2009-04-01 |
| Metamorphic testing of stochastic optimisation Yoo, Shin, 3rd International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2010, pp.192 - 201, University of Nebraska Lincoln, 2010-04-06 |
| Method invocation guided GUI testing of android applications = 메소드 호출 정보를 이용한 안드로이드 앱 GUI 테스팅link Lee, Seonghoi; Yoo, Shin; et al, 한국과학기술원, 2020 |
| Mining Fix Patterns for FindBugs Violations Liu, Kui; Kim, Dongsun; Bissyande, Tegawende F.; Yoo, Shin; Le Traon, Yves, IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, v.47, no.1, pp.165 - 188, 2021-01 |
| MOAD: Modeling Observation-based Approximate Dependency Lee, Seongmin; Binkley, David; Feldt, Robert; Gold, Nicolas; Yoo, Shin, IEEE International Conference on Source Code Analysis and Manipulation, pp.12 - 22, IEEE Computer Society, 2019-09-30 |
| MOBS: Multi-Operator Observation-Based Slicing using Lexical Approximation of Program Dependence Lee, Seongmin; Binkley, David; Gold, Nicolas; Islam, Syed; Krinke, Jens; Yoo, Shin, 40th ACM/IEEE International Conference on Software Engineering (ICSE), pp.302 - 303, IEEE, 2018-05-30 |
| Multimodal Surprise Adequacy Analysis of Inputs for Natural Language Processing DNN Models Kim, Seah; Yoo, Shin, 2nd IEEE/ACM International Conference on Automation of Software Test (AST), pp.80 - 89, IEEE COMPUTER SOC, 2021-05-21 |
| Observation-based approximate dependency modeling and its use for program slicing Lee, Seongmin; Binkley, David; Feldt, Robert; Gold, Nicolas; Yoo, Shin, JOURNAL OF SYSTEMS AND SOFTWARE, v.179, pp.110988, 2021-09 |
| Observational slicing based on visual semantics Yoo, Shin; Binkley, David; Eastman, Roger, JOURNAL OF SYSTEMS AND SOFTWARE, v.129, pp.60 - 78, 2017-07 |
| Optimizing for the number of tests generated in search based test data generation with an application to the oracle cost problem Harman, Mark; Kim, Sung Gon; Lakhotia, Kiran; McMinn, Phil; Yoo, Shin, 3rd International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2010, pp.182 - 191, University of Nebraska Lincoln, 2010-04-06 |
| ORBS and the limits of static slicing Binkley, David; Gold, Nicolas; Harman, Mark; Islam, Syed; Krinke, Jens; Yoo, Shin, IEEE 15th International Working Conference on Source Code Analysis and Manipulation, SCAM 2015, pp.1 - 10, Institute of Electrical and Electronics Engineers Inc., 2015-09-27 |
| ORBS: Language-independent program slicing Binkle, David; Gold, Nicolas; Harman, Mark; Islam, Syed; Krinke, Jens; Yoo, Shin, 22nd ACM SIGSOFT International Symposium on the Foundations of Software Engineering, FSE 2014, pp.109 - 120, ACM Special Interest Group on Software Engineering (SIGSOFT), 2014-11-19 |
Pandemic programming How COVID-19 affects software developers and how their organizations can help Ralph, Paul; Baltes, Sebastian; Adisaputri, Gianisa; Torkar, Richard; Kovalenko, Vladimir; Kalinowski, Marcos; Novielli, Nicole; et al, EMPIRICAL SOFTWARE ENGINEERING, v.25, no.6, pp.4927 - 4961, 2020-11 |
| Pareto efficient multi-objective test case selection Yoo, Shin; Harman, Mark, 2007 ACM International Symposium on Software Testing and Analysis, ISSTA'07 and PADTAD-V Workshop, pp.140 - 150, ACM Special Interest Group on Software Engineering (SIGSOFT), 2007-07-11 |
| Practical Combinatorial Interaction Testing: Empirical Findings on Efficiency and Early Fault Detection Petke, Justyna; Cohen, Myra B.; Harman, Mark; Yoo, Shin, IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, v.41, no.9, pp.901 - 924, 2015-09 |
| Precise Learn-to-Rank Fault Localization Using Dynamic and Static Features of Target Programs Kim, Yunho; Mun, Seokhyun; Yoo, Shin; Kim, Moonzoo, ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, v.28, no.4, pp.1 - 34, 2019-10 |
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