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Clustering test cases to achieve effective & scalable prioritisation incorporating expert knowledge Yoo, Shin; Harman, Mark; Tonella, Paolo; Susi, Angelo, 18th International Symposium on Software Testing and Analysis, ISSTA 2009, pp.201 - 211, Association for Computing Machinery, Inc, 2009-07-22 |
Repairing DNN Architecture: Are We There Yet? Kim, Jinhan; Humbatova, Nargiz; Jahangirova, Gunel; Tonella, Paolo; Yoo, Shin, 2023 IEEE Conference on Software Testing, Verification and Validation (ICST), IEEE, 2023-04 |
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