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A framework for the V&V capability assessment focused on the safety-criticality Yoon, Kyung-A; Park, Seunghun; Bae, Doo-Hwan; Chang, Hoon-Seon; Jung, Jae-Cheon, 13th IEEE International Workshop on Software Technology and Engineering Practice 2005, pp.17 - 24, IEEE, 2005-09-24 |
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