Compensation mechanism for N acceptors in ZnO

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We present a mechanism for the compensation of N acceptors in ZnO through real-space multigrid electronic structure calculations within the local-density-functional approximation. We find that at low N doping levels using a normal N-2 source, O vacancies are the main compensating donors for N acceptors, while N acceptors are compensated via the formation of defect complexes with Zn antisites at high doping levels, When an active plasma N-2 gas is used to increase the N solubility, N acceptors are still greatly compensated by N-2 molecules at oxygen sites and N-acceptor-N-2 complexes, explaining the difficulty in achieving low-resistivity p-type ZnO.
Publisher
AMERICAN PHYSICAL SOC
Issue Date
2001-08
Language
English
Article Type
Article
Keywords

DIFFERENCE-PSEUDOPOTENTIAL METHOD; ZINC-OXIDE; FIRST-PRINCIPLES; THIN-FILMS; NITROGEN ACCEPTORS; NATIVE DEFECTS; ZNSE; GROWTH; BEAM; MBE

Citation

PHYSICAL REVIEW B, v.64, no.8, pp.085120 - 085120

ISSN
0163-1829
URI
http://hdl.handle.net/10203/79577
Appears in Collection
PH-Journal Papers(저널논문)
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