Effects of the resistivity and crystal orientation of the silicon PIN detector on the dark current and radiation response characteristics
- Issue Date
- 2006-10-29
- Language
- English
- Citation
IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD 2006, pp.1068 - 1072
- ISSN
- 1095-7863
- Appears in Collection
- MS-Conference Papers(학술회의논문)
- Files in This Item
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