DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, JH | ko |
dc.contributor.author | Yoo, Hyung Joun | ko |
dc.date.accessioned | 2013-03-03T12:40:06Z | - |
dc.date.available | 2013-03-03T12:40:06Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2001-03 | - |
dc.identifier.citation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.38, no.3, pp.215 - 219 | - |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.uri | http://hdl.handle.net/10203/78710 | - |
dc.description.abstract | A novel noise verification standard, a pi -network consisting of three capacitors and three resistors, is introduced. Since the circuit design hardly needs optimization, if the parameters of the FET are given, the circuit topology and the Values of the circuit elements are deterministic. The proposed pi -network successfully provides noise parameters and S-parameters (S-11 and S-22) similar to those of the active devices under consideration, and the verification circuit is compact enough to be realized on a wafer for any IC process providing capacitors. | - |
dc.language | English | - |
dc.publisher | KOREAN PHYSICAL SOC | - |
dc.subject | PARAMETER MEASUREMENTS | - |
dc.subject | ACCURACY | - |
dc.title | Novel noise verification standard using a pi-section RC network | - |
dc.type | Article | - |
dc.identifier.wosid | 000167502800012 | - |
dc.identifier.scopusid | 2-s2.0-0035532388 | - |
dc.type.rims | ART | - |
dc.citation.volume | 38 | - |
dc.citation.issue | 3 | - |
dc.citation.beginningpage | 215 | - |
dc.citation.endingpage | 219 | - |
dc.citation.publicationname | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.contributor.localauthor | Yoo, Hyung Joun | - |
dc.contributor.nonIdAuthor | Kim, JH | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | PARAMETER MEASUREMENTS | - |
dc.subject.keywordPlus | ACCURACY | - |
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