DC Field | Value | Language |
---|---|---|
dc.contributor.author | Cho, Yong-Hoon | ko |
dc.contributor.author | Kang, TW | ko |
dc.contributor.author | Jhe, W | ko |
dc.date.accessioned | 2013-03-03T10:20:15Z | - |
dc.date.available | 2013-03-03T10:20:15Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2001-12 | - |
dc.identifier.citation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.39, pp.253 - 256 | - |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.uri | http://hdl.handle.net/10203/78353 | - |
dc.description.abstract | We present near-field photoreflectance (NPR) spectroscopic studies of GaAs/Al0.3Ga0.7As quantum well structures using near-field scanning optical microscope with either all uncoated or a metal-coated tapered optical fiber probe. The pump and probe beams are coupled into a single-mode fiber tip using a 2 x 2 fiber coupler, so that both the pump and probe beams are automatically overlapped and focused onto the same sample position. The NPR experiments are, carried out ill illumination-collection mode as a function of excitation intensity and tip-to-sample distance. The NPR technique demonstrated in this work call be used as a complementary tool that probes wore information about higher energy states in various quantum structures. | - |
dc.language | English | - |
dc.publisher | KOREAN PHYSICAL SOC | - |
dc.title | Near-field photoreflectance spectroscopic studies of semiconductor quantum well structures | - |
dc.type | Article | - |
dc.identifier.wosid | 000172968700061 | - |
dc.identifier.scopusid | 2-s2.0-0035542171 | - |
dc.type.rims | ART | - |
dc.citation.volume | 39 | - |
dc.citation.beginningpage | 253 | - |
dc.citation.endingpage | 256 | - |
dc.citation.publicationname | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.contributor.localauthor | Cho, Yong-Hoon | - |
dc.contributor.nonIdAuthor | Kang, TW | - |
dc.contributor.nonIdAuthor | Jhe, W | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article; Proceedings Paper | - |
dc.subject.keywordPlus | OPTICAL MICROSCOPY | - |
dc.subject.keywordPlus | FIBER PROBE | - |
dc.subject.keywordPlus | FORCE | - |
dc.subject.keywordPlus | BEAM | - |
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