TIME SPECTROSCOPIC ELLIPSOMETRY; SILICON FILMS; INFRARED ELLIPSOMETRY; KINETIC ELLIPSOMETRY; DISPERSION-RELATIONS; INSITU ELLIPSOMETRY; HYDROGEN DILUTION; ABSORPTION; SEMICONDUCTORS; NUCLEATION
JOURNAL OF NON-CRYSTALLINE SOLIDS, v.275, no.1-2, pp.59 - 64
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.