Hydrogenation time dependence of a-SiC:H-based P-I-N thin film visible light-emitting diode characteristics

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dc.contributor.authorLee, JWko
dc.contributor.authorLim, Koeng Suko
dc.date.accessioned2013-03-03T05:03:21Z-
dc.date.available2013-03-03T05:03:21Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1996-09-
dc.identifier.citationJAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.35, no.9A, pp.1111 - 1113-
dc.identifier.issn0021-4922-
dc.identifier.urihttp://hdl.handle.net/10203/77344-
dc.description.abstractThe hydrogenation time dependence of hydrogenation effects on the performance of a-SiC:H-based p-i-n thin film light-emitting diodes (TFLEDs) in the visible range has been investigated. It was found that hydrogenation markedly improved the device performance, and that increasing the hydrogenation time beyond a saturation point degraded the device performance; that is, as compared with the performance of a TFLED hydrogenated for a short time (similar to 15 min), the threshold voltage increased slightly, the EL peak shifted towards a longer wavelength, and the brightness decreased. In particular; after hydrogenation for 45 min, the brightness decreased to 15 cd/m(2).-
dc.languageEnglish-
dc.publisherJAPAN J APPLIED PHYSICS-
dc.subjectLAYERS-
dc.titleHydrogenation time dependence of a-SiC:H-based P-I-N thin film visible light-emitting diode characteristics-
dc.typeArticle-
dc.identifier.wosidA1996VG14000005-
dc.identifier.scopusid2-s2.0-0030235529-
dc.type.rimsART-
dc.citation.volume35-
dc.citation.issue9A-
dc.citation.beginningpage1111-
dc.citation.endingpage1113-
dc.citation.publicationnameJAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS-
dc.contributor.localauthorLim, Koeng Su-
dc.contributor.nonIdAuthorLee, JW-
dc.type.journalArticleArticle-
dc.subject.keywordAuthora-SiC:H-
dc.subject.keywordAuthorTFLED-
dc.subject.keywordAuthorhydrogenation-
dc.subject.keywordAuthortime dependence-
dc.subject.keywordPlusLAYERS-
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