Noise parameter extraction of a GaAs MESFET with Monte-Carlo simulation

Abstract

All of the noise parameters of a GaAs metal-semiconductor field-fffect transistor (MESFET) are extracted using 2-dimensional Monte-Carlo simulation for the first time. The general procedure for extracting the noise parameters is presented. The spectrums and correlations of the input-equivalent noise-voltage and noise-current sources are calculated. The y parameters of a GaAs MESFET are also extracted to obtain noise parameters and to analyze device characteristics for the first time.