Fourier-transform analysis of electrostatic potential distribution through a thick slit

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A potential distribution through a slit in a thick conducting plane is examined. The Pourier-transform is used to represent the potential in the spectral domain and the boundary conditions are enforced to represent a solution in closed form. Our solution is in a rapidly converging series so that it is numerically efficient. The Fourier-transform approach is novel in that it allows us to obtain a simple series solution without recourse to the Schwarz-Christoffel transformation.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
1996-02
Language
English
Article Type
Article
Citation

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.38, no.1, pp.77 - 79

ISSN
0018-9375
URI
http://hdl.handle.net/10203/76296
Appears in Collection
EE-Journal Papers(저널논문)
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