Periodic Wear-Limit Replacement with Wear-Dependent Failures

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dc.contributor.authorPark, Kyung Sooko
dc.date.accessioned2013-03-02T17:36:10Z-
dc.date.available2013-03-02T17:36:10Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1996-01-
dc.identifier.citationMICROELECTRONICS RELIABILITY, v.37, no.3, pp.467 - 472-
dc.identifier.issn0026-2714-
dc.identifier.urihttp://hdl.handle.net/10203/74749-
dc.description.abstractAn item undergoes cumulative damage through use. The item fails randomly but the failure rate depends on the accumulated damage. The item is preventively replaced if it survives a certain damage limit at periodic inspections; on failure, it is replaced immediately. The optimal damage limit for preventive replacement which minimizes the long-run expected cost rate is derived. It is unique if an item has increasing damage-dependent failure rate. Numerical example for a stationary gamma process with Weibull distributed failure is given. Copyright (C) 1996 Elsevier Science Ltd.-
dc.languageEnglish-
dc.publisherPergamon-Elsevier Science Ltd-
dc.subjectMODELS-
dc.titlePeriodic Wear-Limit Replacement with Wear-Dependent Failures-
dc.typeArticle-
dc.identifier.wosidA1997WB96500014-
dc.type.rimsART-
dc.citation.volume37-
dc.citation.issue3-
dc.citation.beginningpage467-
dc.citation.endingpage472-
dc.citation.publicationnameMICROELECTRONICS RELIABILITY-
dc.contributor.localauthorPark, Kyung Soo-
dc.type.journalArticleArticle-
dc.subject.keywordPlusMODELS-
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