DC Field | Value | Language |
---|---|---|
dc.contributor.author | KOH, JS | ko |
dc.contributor.author | KIM, CH | ko |
dc.contributor.author | PARK, JI | ko |
dc.contributor.author | Yum, Bong-Jin | ko |
dc.date.accessioned | 2013-03-02T13:11:57Z | - |
dc.date.available | 2013-03-02T13:11:57Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1995-06 | - |
dc.identifier.citation | MICROELECTRONICS RELIABILITY, v.35, no.6, pp.893 - 902 | - |
dc.identifier.issn | 0026-2714 | - |
dc.identifier.uri | http://hdl.handle.net/10203/73667 | - |
dc.description.abstract | Burn-in is an effective means for screening out defects that contribute to infant mortality failures. Various studies have been conducted for determining: the optimum hum-in time for a device. However, most of them assume cost models, which are difficult to quantify. In this article, we take a more realistic approach for determining the effective brim-in time for a PBA(Printed Board Assembly) to satisfy the customer requirement that the failure rate after burr-in be less than a specified value. The proposed method is applied to two types of PBAs used in a certain electronic switching system. | - |
dc.language | English | - |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
dc.title | DETERMINATION OF EFFECTIVE BURN-IN TIME FOR PRINTED BOARD ASSEMBLY | - |
dc.type | Article | - |
dc.identifier.wosid | A1995QT55800003 | - |
dc.identifier.scopusid | 2-s2.0-0029327582 | - |
dc.type.rims | ART | - |
dc.citation.volume | 35 | - |
dc.citation.issue | 6 | - |
dc.citation.beginningpage | 893 | - |
dc.citation.endingpage | 902 | - |
dc.citation.publicationname | MICROELECTRONICS RELIABILITY | - |
dc.contributor.localauthor | Yum, Bong-Jin | - |
dc.contributor.nonIdAuthor | KOH, JS | - |
dc.contributor.nonIdAuthor | KIM, CH | - |
dc.contributor.nonIdAuthor | PARK, JI | - |
dc.type.journalArticle | Article | - |
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