DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Kyung Soo | ko |
dc.date.accessioned | 2013-02-27T20:40:18Z | - |
dc.date.available | 2013-02-27T20:40:18Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1996-01 | - |
dc.identifier.citation | MICROELECTRONICS AND RELIABILITY, v.36, no.3, pp.399 - 401 | - |
dc.identifier.issn | 0026-2714 | - |
dc.identifier.uri | http://hdl.handle.net/10203/70734 | - |
dc.description.abstract | The ratio estimates of subjective human error probabilities obtained from paired comparisons are converted to a best set of relative human error quotients; this subjective ratio scale is then converted into an objectified scale of probabilities using a known objective empirical (anchor) probability. When dependable estimates of human error probabilities are unavailable, the pairwise ratio estimation procedure gives an excellent means of integrating many experts' judgements. | - |
dc.language | English | - |
dc.publisher | Elsevier BV | - |
dc.title | Estimating Human Error Probabilities from paired Ratios | - |
dc.type | Article | - |
dc.identifier.wosid | A1996TN91000017 | - |
dc.identifier.scopusid | 2-s2.0-0030104891 | - |
dc.type.rims | ART | - |
dc.citation.volume | 36 | - |
dc.citation.issue | 3 | - |
dc.citation.beginningpage | 399 | - |
dc.citation.endingpage | 401 | - |
dc.citation.publicationname | MICROELECTRONICS AND RELIABILITY | - |
dc.contributor.localauthor | Park, Kyung Soo | - |
dc.type.journalArticle | Article | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.