Phase-shifting grating projection moire topography
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Choi, YB | ko |
| dc.contributor.author | Kim, Seung-Woo | ko |
| dc.date.accessioned | 2013-02-27T18:32:35Z | - |
| dc.date.available | 2013-02-27T18:32:35Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1998-03 | - |
| dc.identifier.citation | OPTICAL ENGINEERING, v.37, no.3, pp.1005 - 1010 | - |
| dc.identifier.issn | 0091-3286 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/70123 | - |
| dc.description.abstract | A phase-shifting projection moire method particularly intended for high-speed three-dimensional inspection of fine objects is presented. Emphasis is on realization of phase-shifting fringe analysis in projection moire topography using a set of line grating pairs designed to provide different phase shifts in sequence. Further, a time-integral fringe capturing scheme is devised to remove undesirable high-frequency original grating patterns in real time without time-consuming software image processing. Finally, the performances of the proposed method are discussed with measurement results. (C) 1998 Society of Photo-Optical Instrumentation Engineers. [S0091-3286(98)03503-X]. | - |
| dc.language | English | - |
| dc.publisher | SPIE - INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING | - |
| dc.subject | INTERFEROMETRY | - |
| dc.title | Phase-shifting grating projection moire topography | - |
| dc.type | Article | - |
| dc.identifier.wosid | 000072530200036 | - |
| dc.identifier.scopusid | 2-s2.0-0000943803 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 37 | - |
| dc.citation.issue | 3 | - |
| dc.citation.beginningpage | 1005 | - |
| dc.citation.endingpage | 1010 | - |
| dc.citation.publicationname | OPTICAL ENGINEERING | - |
| dc.contributor.localauthor | Kim, Seung-Woo | - |
| dc.contributor.nonIdAuthor | Choi, YB | - |
| dc.type.journalArticle | Article | - |
| dc.subject.keywordAuthor | projection moire topography | - |
| dc.subject.keywordAuthor | phase-shifting fringe analysis | - |
| dc.subject.keywordAuthor | line-gratings | - |
| dc.subject.keywordAuthor | three-dimensional inspection of fine objects | - |
| dc.subject.keywordAuthor | time-integral fringe capturing | - |
| dc.subject.keywordPlus | INTERFEROMETRY | - |
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