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Structural and dielectric properties of epitaxial Ba0.6Sr0.4TiO3 thin films grown on Si substrates with thin SrO buffer layers Kim, HS; Hyun, TS; Kim, Ho Gi; Yun, TS; Lee, JC; Kim, Il-Doo, JOURNAL OF ELECTROCERAMICS, v.18, pp.305 - 309, 2007-08 |
Thermal oxidation of tantalum films at various oxidation states from 300 to 700 degrees C Chandrasekharan, R; Park, Inkyu; Masel, RI; Shannon, MA, JOURNAL OF APPLIED PHYSICS, v.98, no.11, 2005-12 |
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