| 78641 | Hot target inspection based on fiber acoustic wave PZT sensor and Q-switched pulsed laser Jang, SG; Chia, CC; Lee, Jung Ryul; Lee, SS; Kang, DH, 38th International Conference and NDT Exposition DEFEKTOSKOPIE 2008, Czech Society for NDT, 2008-11 |
| 78642 | Hot target inspection using a welded fibre acoustic wave piezoelectric sensor and a laser-ultrasonic mirror scanner Chia, Chen Ciang; Lee, Jung-Ryul; Shin, He-Jin, MEASUREMENT SCIENCE & TECHNOLOGY, v.20, no.12, 2009-12 |
| 78643 | Hot topics in surface science: Quantum dots for optoelectronic applications (HTSS-QDOA) Woo, Ju Young; Kim, Whi Dong; Lee, Doh Chang, APPLIED SURFACE SCIENCE ADVANCES, v.5, no.SI, pp.100092, 2021-09 |
| 78644 | Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFETs with recessed LOCOS isolation structure Yue, JMP; Chim, WK; Cho, Byung Jin; Chan, DSH; Qin, WH; Kim, YB; Jang, SA; et al, IEEE ELECTRON DEVICE LETTERS, v.21, no.3, pp.130 - 132, 2000-03 |
| 78645 | Hot-carrier effects in BC-MOSDET and new CMOS logic circuits for high reliability = 매몰채놀 MOSFET 에서의 Hot-carrier 효과와 높은 신뢰성을 갖는 새로운 CMOS 논리 회로link Park, Heung-Joon; 박흥준; et al, 한국과학기술원, 1989 |
| 78646 | Hot-carrier effects in FinFETs = FinFETs의 Hot-Carrier 효과link Han, Jin-Woo; 한진우; et al, 한국과학기술원, 2006 |
| 78647 | Hot-carrier lifetime dependence on channel width and silicon recess depth in N-channel metal-oxide-semiconductor field-effect-transistors with the recessed local oxidation of silicon isolation structure Chim, WK; Cho, Byung Jin; Yue, JMP, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.1, pp.47 - 53, 2002-01 |
| 78648 | Hot-electron-based solar energy conversion with metal-semiconductor nanodiodes Lee, Young Keun; Lee, Hyosun; Lee, Changhwan; Hwang, Euyheon; Park, Jeong Young, JOURNAL OF PHYSICS-CONDENSED MATTER, v.28, no.25, 2016-06 |
| 78649 | Hot-Electron-Mediated Surface Chemistry: Toward Electronic Control of Catalytic Activity Park, Jeong Young; Kim, Sun Mi; Lee, Hyosun; Nedrygailov, Ievgen I., ACCOUNTS OF CHEMICAL RESEARCH, v.48, no.8, pp.2475 - 2483, 2015-08 |
| 78650 | Hot-filament 화학증착법에 의한 다이아몬드의 성장에 관한 연구 = A study on the diamond growth by hot-filament chemical vapor depositionlink 권대원; Kweon, Dae-Weon; et al, 한국과학기술원, 1991 |
| 78651 | Hot-filament 화학증착법에서 다이아몬드 합성에 미치는 산소첨가 효과에 관한 연구 = A study on the effect of oxygen addition on diamond synthesis by hot-filament chemical vapor depositionlink 정재한; Jung, Jae-Han; et al, 한국과학기술원, 1993 |
| 78652 | Hot-filament 화학증착법으로 제조한 다이아몬드의 반응압력에 따른 핵생성 거동에 관한 연구 = A study on the nucleation behavior for the reation pressure of the diamond synthesised by the hot-filament chemical vapor depositionlink 김동국; Kim, Dong-Gook; et al, 한국과학기술원, 1992 |
| 78653 | Hot-filament 화학증착법으로 제조한 다이아몬드의 성장특성에 관한 연구 = A study on the growth characteristics of diamond prepared by hot-filament chemical vapor depositionlink 김종성; Kim, Jong-Sung; et al, 한국과학기술원, 1989 |
| 78654 | Hot-Wall LP-MOCVD를 이용한 $(Pb,La)TiO_3$박막의 제조 및 특성평가에 관한 연구 = Preparation and characterization of $(Pb,La)Ti)_3$ thin films by hot-wall LP-MOCVDlink Lee, Seaung-Suk; 이승석; et al, 한국과학기술원, 1996 |
| 78655 | Hot-Wire CVD 방법을 이용한 (100) Si과 다결정 Si 씨앗층에서의 저온 에피택셜 Si 성장에 관한 연구 = low-temperature growth of epitaxial Si on (100) Si and poly-Si seed layer using hot-wire CVDlink 이승렬; Lee, Seung-Ryul; et al, 한국과학기술원, 2008 |
| 78656 | Hot-Wire CVD방법을 이용한 저온 에피택셜 실리콘 박막의 표면 텍스처 형성 Ahn, Byung Tae, 한국재료학회 추계학술발표대회, 2007-11-02 |
| 78657 | Hot-wire Measurements of Near Wakes Behind an Oscillating Airfoil Park, Seung O; Kim, Jong Seong; Lee, Boo Il, AIAA-88-3715-CP, 1988-07 |
| 78658 | HOT-WIRE MEASUREMENTS OF NEAR WAKES BEHIND AN OSCILLATING AIRFOIL Park, Seung O; KIM, JS; LEE, BI, AIAA JOURNAL , v.28, no.1, pp.22 - 28, 1990-01 |
| 78659 | HOT-WIRE, LASER-ANEMOMETER, AND FORCE MEASUREMENTS OF INTERACTING TRAILING VORTICES IVERSEN, JD; CORSIGLIA, VR; Park, Seung O; BACKHUS, DR; BRICKMAN, RA, JOURNAL OF AIRCRAFT, v.16, no.7, pp.448 - 454, 1979 |
| 78660 | HOTFUZ: Cost-effective higher-order mutation-based fault localization Jang, Jong-In; Ryu, Duksan; Baik, Jongmoon, SOFTWARE TESTING VERIFICATION & RELIABILITY, v.32, no.8, 2022-12 |
