Optimal Designs of Partially Accelerated Life Tests for Weibull Distributions
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정상욱 | ko |
| dc.contributor.author | 배도선 | ko |
| dc.date.accessioned | 2013-02-27T15:26:03Z | - |
| dc.date.available | 2013-02-27T15:26:03Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1998 | - |
| dc.identifier.citation | 대한산업공학회지, v.24, no.3, pp.367 - 379 | - |
| dc.identifier.issn | 1225-0988 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/69337 | - |
| dc.language | Korean | - |
| dc.publisher | 대한산업공학회 | - |
| dc.title | Optimal Designs of Partially Accelerated Life Tests for Weibull Distributions | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 24 | - |
| dc.citation.issue | 3 | - |
| dc.citation.beginningpage | 367 | - |
| dc.citation.endingpage | 379 | - |
| dc.citation.publicationname | 대한산업공학회지 | - |
| dc.contributor.nonIdAuthor | 정상욱 | - |
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