A condition on spatial resolution of IR collimators for testing of thermal imaging systems
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chrzanowski, K | ko |
| dc.contributor.author | Lee, Hee Chul | ko |
| dc.contributor.author | Wrona, W | ko |
| dc.date.accessioned | 2013-02-27T09:12:55Z | - |
| dc.date.available | 2013-02-27T09:12:55Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2000-05 | - |
| dc.identifier.citation | OPTICAL ENGINEERING, v.39, no.5, pp.1413 - 1417 | - |
| dc.identifier.issn | 0091-3286 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/67686 | - |
| dc.description.abstract | A precise condition on the spatial resolution of the IR collimator for testing thermal imaging systems is presented. The condition can be used even if only the spatial resolution of the IR collimator and that of the system under test, measured using popular definitions, are known. It is shown that when the condition is fulfilled, the thermal image degradation caused by the IR collimator is negligible. (C) 2000 Society of Photo-Optical Instrumentation Engineers. | - |
| dc.language | English | - |
| dc.publisher | SPIE-INT SOCIETY OPTICAL ENGINEERING | - |
| dc.title | A condition on spatial resolution of IR collimators for testing of thermal imaging systems | - |
| dc.type | Article | - |
| dc.identifier.wosid | 000086990800041 | - |
| dc.identifier.scopusid | 2-s2.0-0033715556 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 39 | - |
| dc.citation.issue | 5 | - |
| dc.citation.beginningpage | 1413 | - |
| dc.citation.endingpage | 1417 | - |
| dc.citation.publicationname | OPTICAL ENGINEERING | - |
| dc.identifier.doi | 10.1117/1.602507 | - |
| dc.contributor.localauthor | Lee, Hee Chul | - |
| dc.contributor.nonIdAuthor | Chrzanowski, K | - |
| dc.contributor.nonIdAuthor | Wrona, W | - |
| dc.type.journalArticle | Article | - |
| dc.subject.keywordAuthor | infrared | - |
| dc.subject.keywordAuthor | FLIR | - |
| dc.subject.keywordAuthor | instrumentation | - |
| dc.subject.keywordAuthor | measurement | - |
| dc.subject.keywordAuthor | metrology | - |
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