DC Field | Value | Language |
---|---|---|
dc.contributor.author | LEE, WG | ko |
dc.contributor.author | Woo, Seong-Ihl | ko |
dc.contributor.author | KIM, JC | ko |
dc.contributor.author | CHOI, SH | ko |
dc.contributor.author | OH, KH | ko |
dc.date.accessioned | 2013-02-27T03:56:34Z | - |
dc.date.available | 2013-02-27T03:56:34Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1994-01 | - |
dc.identifier.citation | THIN SOLID FILMS, v.237, no.1-2, pp.105 - 111 | - |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.uri | http://hdl.handle.net/10203/66311 | - |
dc.description.abstract | Titanium dioxide (TiO2) thin films were prepared on silicon substrates by plasma-enhanced chemical vapor deposition (PECVD) using Ti(O-i-C3H7)(4) and oxygen. PECVD of TiO2 films has been evaluated with various process parameters. The characteristics of films were investigated by X-ray diffraction, scanning electron microscopy, TG/DTA, FTIR, UV/visible spectroscopy and Auger electron spectroscopy. Typical as-deposited film was amorphous and transparent with a refractive index of 2.05. As the deposition time increased, surface morphology became coarser, and structure was transformed from amorphous to mixtures of amorphous and crystal. As-deposited amorphous TiO2 films had a dielectric constant of 13.7 and flat-band voltage of -1.3 V. The effects of post-treatment through N-2 or O-2 plasma on the electrical properties of as-deposited films were evaluated. Electrical properties could be enhanced by O-2 plasma treatment. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE SA LAUSANNE | - |
dc.subject | ALUMINUM-OXIDE | - |
dc.subject | PRECURSOR | - |
dc.subject | WATER | - |
dc.title | PREPARATION AND PROPERTIES OF AMORPHOUS TIO2 THIN-FILMS BY PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION | - |
dc.type | Article | - |
dc.identifier.wosid | A1994MP77200018 | - |
dc.type.rims | ART | - |
dc.citation.volume | 237 | - |
dc.citation.issue | 1-2 | - |
dc.citation.beginningpage | 105 | - |
dc.citation.endingpage | 111 | - |
dc.citation.publicationname | THIN SOLID FILMS | - |
dc.contributor.localauthor | Woo, Seong-Ihl | - |
dc.contributor.nonIdAuthor | LEE, WG | - |
dc.contributor.nonIdAuthor | KIM, JC | - |
dc.contributor.nonIdAuthor | CHOI, SH | - |
dc.contributor.nonIdAuthor | OH, KH | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | ALUMINUM-OXIDE | - |
dc.subject.keywordPlus | PRECURSOR | - |
dc.subject.keywordPlus | WATER | - |
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