DC Field | Value | Language |
---|---|---|
dc.contributor.author | KANG, H | ko |
dc.contributor.author | PARK, KH | ko |
dc.contributor.author | KIM, C | ko |
dc.contributor.author | SHIM, BS | ko |
dc.contributor.author | Kim, Sehun | ko |
dc.contributor.author | MOON, DW | ko |
dc.date.accessioned | 2013-02-25T22:35:49Z | - |
dc.date.available | 2013-02-25T22:35:49Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1992-04 | - |
dc.identifier.citation | NUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v.67, no.1-4, pp.312 - 315 | - |
dc.identifier.issn | 0168-583X | - |
dc.identifier.uri | http://hdl.handle.net/10203/65783 | - |
dc.description.abstract | It is shown that point defects are predominantly generated by irradiating low energy noble gas ions onto a graphite(0001) surface. Scanning tunneling microscopic images of the graphite surface irradiated with 50 eV Ar+ ions show a structure corresponding to a point defect in which only one or two surface atoms are displaced. The process of ion penetration and trapping into the graphite is investigated as a function of ion energy in the range of 1-500 eV. Trapping efficiency rapidly increases with ion energy in the threshold region (10-100 eV), and leads to a saturation for higher energies. The penetration and trapping mechanism is discussed in relation to defect formation on the surface. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | SCANNING TUNNELING MICROSCOPY | - |
dc.title | POINT-DEFECT FORMATION ON GRAPHITE SURFACE INDUCED BY ION IMPACT AT ENERGIES NEAR PENETRATION THRESHOLD | - |
dc.type | Article | - |
dc.identifier.wosid | A1992HR30800066 | - |
dc.identifier.scopusid | 2-s2.0-0005642229 | - |
dc.type.rims | ART | - |
dc.citation.volume | 67 | - |
dc.citation.issue | 1-4 | - |
dc.citation.beginningpage | 312 | - |
dc.citation.endingpage | 315 | - |
dc.citation.publicationname | NUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | - |
dc.contributor.localauthor | Kim, Sehun | - |
dc.contributor.nonIdAuthor | KANG, H | - |
dc.contributor.nonIdAuthor | PARK, KH | - |
dc.contributor.nonIdAuthor | KIM, C | - |
dc.contributor.nonIdAuthor | SHIM, BS | - |
dc.contributor.nonIdAuthor | MOON, DW | - |
dc.type.journalArticle | Article; Proceedings Paper | - |
dc.subject.keywordPlus | SCANNING TUNNELING MICROSCOPY | - |
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