A Research for Development of H.V.Line Current Tester
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ju-Jang Lee | ko |
| dc.contributor.author | NH Kim | ko |
| dc.date.accessioned | 2013-02-25T19:05:21Z | - |
| dc.date.available | 2013-02-25T19:05:21Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1977-01 | - |
| dc.identifier.citation | JOURNAL OF THE KOREAN ELECTRICAL RESEARCH AND TESTING INSTITUTE, v.1, no.2, pp.3 - 11 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/64542 | - |
| dc.language | English | - |
| dc.publisher | Journal of the Korean Electrical Research and Testing Institute | - |
| dc.title | A Research for Development of H.V.Line Current Tester | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 1 | - |
| dc.citation.issue | 2 | - |
| dc.citation.beginningpage | 3 | - |
| dc.citation.endingpage | 11 | - |
| dc.citation.publicationname | JOURNAL OF THE KOREAN ELECTRICAL RESEARCH AND TESTING INSTITUTE | - |
| dc.contributor.localauthor | Ju-Jang Lee | - |
| dc.contributor.nonIdAuthor | NH Kim | - |
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