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Thermally Triggered Degradation of Transient Electronic Devices

Park, Chan Woo; Kang, Seung-Kyun; Hernandez, Hector Lopez; Kaitz, Joshua A.; Wie, Dae Seung; Shin, Jiho; Lee, Olivia P.; et al, ADVANCED MATERIALS, v.27, no.25, pp.3783 - 3788, 2015-07

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