High Yield Fabrication of Carbon Nanotube-Modified Scanning Probe Microscopy Tip Using

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dc.contributor.authorLee, Hyung Woo-
dc.contributor.authorHan, Chang Soo-
dc.contributor.authorKim, Soo Hyun-
dc.contributor.authorKwak, Yoon Keun-
dc.date.accessioned2008-07-22T08:34:09Z-
dc.date.available2008-07-22T08:34:09Z-
dc.date.created2012-02-06-
dc.date.issued2004-11-03-
dc.identifier.citationThe 2nd international symposium on nanomanufacturing, v., no., pp.391 - 393-
dc.identifier.urihttp://hdl.handle.net/10203/6284-
dc.description.sponsorshipThis research was supported by a grant from Center for Nanoscale Mechatronics & Manufacturing of 21st Century Frontier Research Program and the Brain Korea 21 Project in 2004.en
dc.languageENG-
dc.language.isoen_USen
dc.publisherISNM-
dc.titleHigh Yield Fabrication of Carbon Nanotube-Modified Scanning Probe Microscopy Tip Using-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage391-
dc.citation.endingpage393-
dc.citation.publicationnameThe 2nd international symposium on nanomanufacturing-
dc.contributor.localauthorKwak, Yoon Keun-
dc.contributor.nonIdAuthorLee, Hyung Woo-
dc.contributor.nonIdAuthorHan, Chang Soo-
dc.contributor.nonIdAuthorKim, Soo Hyun-

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