Browse "BiS-Conference Papers(학술회의논문)" by Author Jeon, Daejong

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Fast and accurate penalized maximum likelihood estimation of localization microscopy using Poisson noise model

Kim, Kyung Sang; Min, Junhong; Carlini, Lina; Unser, Michael; Manley, Suliana; Jeon, Daejong; Ye, Jong Chul, Sampling Theory and Applications (SAMPTA), IEEE, 2013-07

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