Browse "ME-Journal Papers(저널논문)" by Subject thickness measurements

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Subsurface Imaging of Microfabricated Silicon Membrane-Cavity Structures Using Near-Infrared Interferometry

Jeong, Mun Goung; Kim, Taeyeong; Lee, Bong Jae; Lee, Jungchul, ADVANCED ENGINEERING MATERIALS, v.24, no.10, 2022-10

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