Showing results 1 to 5 of 5
Effects of Thickness and Crystallographic Orientation on Tensile Properties of Thinned Silicon Wafers Lee, Sangmin; Kim, Jae-Han; Kim, Young Suk; Ohba, Takayuki; Kim, Taek-Soo, IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.10, no.2, pp.1 - 1, 2020-02 |
Intrinsic Mechanical Properties of Free-Standing SiNx Thin Films Depending on PECVD Conditions for Controlling Residual Stress Oh, Seung Jin; Ma, Boo Soo; Yang, Chanhee; Kim, Taek-Soo, ACS APPLIED ELECTRONIC MATERIALS, v.4, no.8, pp.3980 - 3987, 2022-08 |
Measurement of mechanical properties of electroplated nickel thin film Baek, D.-C.; Park, T.-S.; Lee, Soon-Bok, ADVANCES IN FRACTURE AND FAILURE PREVENTION, PTS 1 AND 2, v.261-263, pp.417 - 422, 2004 |
Unveiling the Annealing-Dependent Mechanical Properties of Freestanding Indium Tin Oxide Thin Films Oh, Seung Jin; Kwon, Jeong Hyun; Lee, Sangmin; Choi, Kyung Cheol; Kim, Taek-Soo, ACS APPLIED MATERIALS & INTERFACES, v.13, no.14, pp.16650 - 16659, 2021-04 |
Why mussel byssal plaques are tiny yet strong in attachment Qureshi, Daanish Aleem; Goffredo, Stephen; Kim, Yongtae; Han, Yulong; Guo, Ming; Ryu, Seunghwa; Qin, Zhao, MATTER, v.5, no.2, pp.710 - 724, 2022-02 |
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